Comparison of forward models and phase retrieval for image formation from intensity interferometer data

2013 ◽  
Author(s):  
David Gerwe ◽  
Peter Crabtree ◽  
Richard Holmes ◽  
Jean Dolne
Keyword(s):  
Phase Retrieval ◽  
Image Formation ◽  
Forward Models ◽  
Intensity Interferometer

scholarly journals X-ray Bragg magnifier microscope as a linear shift invariant imaging system: image formation and phase retrieval

2014 ◽  
Vol 22 (18) ◽  
pp. 21508 ◽  
Author(s):  
P. Vagovič ◽  
L. Švéda ◽  
A. Cecilia ◽  
E. Hamann ◽  
D. Pelliccia ◽  
...  
Keyword(s):  
Phase Retrieval ◽  
Imaging System ◽  
Image Formation ◽  
X Ray

The 'well-known' theory of electron image formation

1983 ◽  
Vol 41 ◽  
pp. 288-289
Author(s):  
M.A. O'Keefe ◽  
W.O. Saxton
Keyword(s):  
Image Processing ◽  
Image Formation ◽  
Source Profiles ◽  
Electron Image

A recent paper by Kirkland on nonlinear electron image processing, referring to a relatively new textbook, highlights the persistence in the literature of calculations based on incomplete and/or incorrect models of electron imageing, notwithstanding the various papers which have recently pointed out the correct forms of the appropriate equations. Since at least part of the problem can be traced to underlying assumptions about the illumination coherence conditions, we attempt to clarify both the assumptions and the corresponding equations in this paper, illustrating the effects of an incorrect theory by means of images calculated in different ways.The first point to be made clear concerning the illumination coherence conditions is that (except for very thin specimens) it is insufficient simply to know the source profiles present, i.e. the ranges of different directions and energies (focus levels) present in the source; we must also know in general whether the various illumination components are coherent or incoherent with respect to one another.

Observation of Phase Contrast Images in STEM and CTEM Modes by Using 100 kV Field Emission Electron Gun

1974 ◽  
Vol 32 ◽  
pp. 390-391
Author(s):  
Y. Harada ◽  
T. Goto ◽  
H. Koike ◽  
T. Someya
Keyword(s):  
Field Emission ◽  
Phase Contrast ◽  
Image Formation ◽  
Fresnel Diffraction ◽  
Experimental Results ◽  
Electron Gun ◽  
Scanning Microscopy ◽  
Emission Electron ◽  
Lattice Images

Since phase contrasts of STEM images, that is, Fresnel diffraction fringes or lattice images, manifest themselves in field emission scanning microscopy, the mechanism for image formation in the STEM mode has been investigated and compared with that in CTEM mode, resulting in the theory of reciprocity. It reveals that contrast in STEM images exhibits the same properties as contrast in CTEM images. However, it appears that the validity of the reciprocity theory, especially on the details of phase contrast, has not yet been fully proven by the experiments. In this work, we shall investigate the phase contrast images obtained in both the STEM and CTEM modes of a field emission microscope (100kV), and evaluate the validity of the reciprocity theory by comparing the experimental results.

Image formation analysis of thick biological specimens using three-dimensional power-spectra of through focus series

1994 ◽  
Vol 52 ◽  
pp. 124-125
Author(s):  
Karen F. Han
Keyword(s):  
Inelastic Scattering ◽  
Imaging Techniques ◽  
Mass Density ◽  
Relative Proportion ◽  
Three Dimensional ◽  
Power Spectra ◽  
Image Formation ◽  
Energy Filtering ◽  
Ewald Sphere ◽  
Nonlinear Imaging

The primary focus in our laboratory is the study of higher order chromatin structure using three dimensional electron microscope tomography. Three dimensional tomography involves the deconstruction of an object by combining multiple projection views of the object at different tilt angles, image intensities are not always accurate representations of the projected object mass density, due to the effects of electron-specimen interactions and microscope lens aberrations. Therefore, an understanding of the mechanism of image formation is important for interpreting the images. The image formation for thick biological specimens has been analyzed by using both energy filtering and Ewald sphere constructions. Surprisingly, there is a significant amount of coherent transfer for our thick specimens. The relative amount of coherent transfer is correlated with the relative proportion of elastically scattered electrons using electron energy loss spectoscopy and imaging techniques.Electron-specimen interactions include single and multiple, elastic and inelastic scattering. Multiple and inelastic scattering events give rise to nonlinear imaging effects which complicates the interpretation of collected images.

Quantitative analysis by reconstruction of HREM focal series

1994 ◽  
Vol 52 ◽  
pp. 740-741
Author(s):  
W. Coene ◽  
A. Thust ◽  
M. Op de Beeck ◽  
D. Van Dyck
Keyword(s):  
Phase Retrieval ◽  
Image Plane ◽  
Initial Guess ◽  
Recursive Least Squares ◽  
Objective Lens ◽  
Electron Wave ◽  
Electron Sources ◽  
Original Algorithm ◽  
Coherent Field ◽  
Direct Interpretation

Compared to conventional electron sources, the use of a highly coherent field-emission gun (FEG) in TEM improves the information resolution considerably. A direct interpretation of this extra information, however, is hampered since amplitude and phase of the electron wave are scrambled in a complicated way upon transfer from the specimen exit plane through the objective lens towards the image plane. In order to make the additional high-resolution information interpretable, a phase retrieval procedure is applied, which yields the aberration-corrected electron wave from a focal series of HRTEM images (Coene et al, 1992).Kirkland (1984) tackled non-linear image reconstruction using a recursive least-squares formalism in which the electron wave is modified stepwise towards the solution which optimally matches the contrast features in the experimental through-focus series. The original algorithm suffers from two major drawbacks : first, the result depends strongly on the quality of the initial guess of the first step, second, the processing time is impractically high.

Limitations to the Spacing Effect

2005 ◽  
Vol 52 (4) ◽  
pp. 257-263 ◽  
Author(s):  
Peter P. J. L. Verkoeijen ◽  
Remy M. J. P. Rikers ◽  
Henk G. Schmidt
Keyword(s):  
Free Recall ◽  
Phase Retrieval ◽  
Incidental Learning ◽  
Factor Model ◽  
Recall Performance ◽  
Spacing Effect ◽  
Word List ◽  
Intentional Learning ◽  
Study Phase ◽  
Learning Condition

Abstract. The spacing effect refers to the finding that memory for repeated items improves when the interrepetition interval increases. To explain the spacing effect in free-recall tasks, a two-factor model has been put forward that combines mechanisms of contextual variability and study-phase retrieval (e.g., Raaijmakers, 2003 ; Verkoeijen, Rikers, & Schmidt, 2004 ). An important, yet untested, implication of this model is that free recall of repetitions should follow an inverted u-shaped relationship with interrepetition spacing. To demonstrate the suggested relationship an experiment was conducted. Participants studied a word list, consisting of items repeated at different interrepetition intervals, either under incidental or under intentional learning instructions. Subsequently, participants received a free-recall test. The results revealed an inverted u-shaped relationship between free recall and interrepetition spacing in both the incidental-learning condition and the intentional-learning condition. Moreover, for intentionally learned repetitions, the maximum free-recall performance was located at a longer interrepetition interval than for incidentally learned repetitions. These findings are interpreted in terms of the two-factor model of spacing effects in free-recall tasks.

Study-Phase Retrieval: Suppressing False Recognition in a Repetition Paradigm

2007 ◽  
Author(s):  
Peter M. Wessels ◽  
Jonathan Schnader ◽  
Allison Smith ◽  
Christopher Thomas ◽  
Haley Titus
Keyword(s):  
False Recognition ◽  
Phase Retrieval ◽  
Study Phase

X-ray microscopy by phase-retrieval methods at the advanced light source

2003 ◽  
Vol 104 ◽  
pp. 557-561 ◽  
Author(s):  
M. R. Howells ◽  
H. Chapman ◽  
S. Hau-Riege ◽  
H. He ◽  
S. Marchesini ◽  
...  
Keyword(s):  
Light Source ◽  
Phase Retrieval ◽  
X Ray ◽  
Advanced Light Source
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