Effects of incomplete light extinction in frequency-agile, rapid scanning spectroscopy

2013 ◽  
Author(s):  
D. A. Long ◽  
S. Wójtewicz ◽  
J. T. Hodges
Keyword(s):  
Light Extinction ◽  
Frequency Agile ◽  
Scanning Spectroscopy ◽  
Rapid Scanning

scholarly journals Frequency-agile, rapid scanning spectroscopy

2013 ◽  
Vol 7 (7) ◽  
pp. 532-534 ◽  
Author(s):  
G.-W. Truong ◽  
K. O. Douglass ◽  
S. E. Maxwell ◽  
R. D. van Zee ◽  
D. F. Plusquellic ◽  
...  
Keyword(s):  
Frequency Agile ◽  
Scanning Spectroscopy ◽  
Rapid Scanning

Frequency-Agile, Rapid Scanning Spectroscopy for Ultrasensitive Absorption Measurements

CLEO: 2013 ◽  
2013 ◽  
Author(s):  
D. A. Long ◽  
G.-W. Truong ◽  
K. O. Douglass ◽  
S. E. Maxwell ◽  
R .D. van Zee ◽  
...  
Keyword(s):  
Frequency Agile ◽  
Scanning Spectroscopy ◽  
Rapid Scanning ◽  
Absorption Measurements

Frequency-agile, rapid scanning spectroscopy: absorption sensitivity of 2 × 10−12 cm−1 Hz−1/2 with a tunable diode laser

2013 ◽  
Vol 114 (4) ◽  
pp. 489-495 ◽  
Author(s):  
D. A. Long ◽  
G.-W. Truong ◽  
R. D. van Zee ◽  
D. F. Plusquellic ◽  
J. T. Hodges
Keyword(s):  
Diode Laser ◽  
Tunable Diode Laser ◽  
Frequency Agile ◽  
Scanning Spectroscopy ◽  
Rapid Scanning ◽  
Absorption Sensitivity

Rapid Scanning Spectroscopy: Prelude to a New Era in Analytical Spectroscopy

1973 ◽  
Vol 45 (11) ◽  
pp. 915A-927A
Author(s):  
Robert E. Santini ◽  
Michael J. Milano ◽  
Harry L. Pardue
Keyword(s):  
New Era ◽  
Analytical Spectroscopy ◽  
Scanning Spectroscopy ◽  
Rapid Scanning

scholarly journals Conjugating precision and acquisition time in a Doppler broadening regime by interleaved frequency-agile rapid-scanning cavity ring-down spectroscopy

2017 ◽  
Vol 147 (13) ◽  
pp. 134201 ◽  
Author(s):  
Riccardo Gotti ◽  
Davide Gatti ◽  
Piotr Masłowski ◽  
Marco Lamperti ◽  
Michele Belmonte ◽  
...  
Keyword(s):  
Acquisition Time ◽  
Doppler Broadening ◽  
Cavity Ring Down Spectroscopy ◽  
Frequency Agile ◽  
Rapid Scanning ◽  
Cavity Ring Down

Thin-layer ultraviolet–visible reflectance spectroelectrochemistry with a spinning-grating monochromator

1990 ◽  
Vol 68 (12) ◽  
pp. 2234-2238 ◽  
Author(s):  
David H. Jones ◽  
A. Scott Hinman
Keyword(s):  
Time Delay ◽  
Thin Layer ◽  
Noise Level ◽  
Point Spectrum ◽  
Spectral Bandwidth ◽  
Grating Monochromator ◽  
Uv Visible ◽  
Scanning Spectroscopy ◽  
Visible Reflectance ◽  
Rapid Scanning

A thin-layer UV–visible spectroelectrochemistry system has been constructed using a commercially available spinning-grating monochromator. The spectroelectrochemical experiment is capable of scanning a wavelength range of 369 to 617 nm in 2.1 ms. The time delay between successive scans is 83 ms. The maximum peak-to-peak noise level in a 300-point spectrum collected during 2.1 ms with a spectral bandwidth of 2 nm is 0.03 absorbance units. The anodic spectroelectrochemistry of tetraphenylporphinatocopper(II), studied using the system, is presented. Keywords: thin-layer spectroelectrochemistry, rapid-scanning spectroscopy, spinning-grating monochromator, tetraphenylporphinatocopper(II).

Rapid scanning spectroscopy. Prelude to a new era in analytical spectroscopy

1973 ◽  
Vol 45 (11) ◽  
pp. 915A-927a ◽  
Author(s):  
Robert E. Santini ◽  
Michael J. Milano ◽  
Harry L. Pardue
Keyword(s):  
New Era ◽  
Analytical Spectroscopy ◽  
Scanning Spectroscopy ◽  
Rapid Scanning

Roughness measurements of nonlinear optical polymer films by scanning tunneling microscopy

1989 ◽  
Vol 47 ◽  
pp. 22-23
Author(s):  
I. H. Musselman ◽  
R.-T. Chen ◽  
P. E. Russell
Keyword(s):  
Surface Roughness ◽  
Scanning Tunneling Microscopy ◽  
Nonlinear Optical ◽  
Polymer Surface ◽  
Light Extinction ◽  
Scanning Tunneling ◽  
Silicon Substrates ◽  
Tunneling Microscopy ◽  
Optical Polymer ◽  
Total Light

Scanning tunneling microscopy (STM) has been used to characterize the surface roughness of nonlinear optical (NLO) polymers. A review of STM of polymer surfaces is included in this volume. The NLO polymers are instrumental in the development of electrooptical waveguide devices, the most fundamental of which is the modulator. The most common modulator design is the Mach Zehnder interferometer, in which the input light is split into two legs and then recombined into a common output within the two dimensional waveguide. A π phase retardation, resulting in total light extinction at the output of the interferometer, can be achieved by changing the refractive index of one leg with respect to the other using the electrooptic effect. For best device performance, it is essential that the NLO polymer exhibit minimal surface roughness in order to reduce light scattering. Scanning tunneling microscopy, with its high lateral and vertical resolution, is capable of quantifying the NLO polymer surface roughness induced by processing. Results are presented below in which STM was used to measure the surface roughness of films produced by spin-coating NLO-active polymers onto silicon substrates.

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