Correlation of current-voltage characteristics of step-edge YBa2Cu3O7 Josephson junctions with the step angle

1994 ◽  
Author(s):  
K. Herrmann ◽  
Michael Siegel ◽  
Gerhard Kunkel ◽  
A. Thust ◽  
B. Kabius ◽  
...  
Keyword(s):  
Josephson Junctions ◽  
Step Edge ◽  
Current Voltage ◽  
Current Voltage Characteristics

High Temperature Superconducting Step-Edge SNS Josephson Junctions on Silicon Substrates

1995 ◽  
Vol 401 ◽  
Author(s):  
P. A. Rosenthal ◽  
J. E. Cosgrove ◽  
D. B. Fenner ◽  
L. R. Vale ◽  
R. H. Ono ◽  
...  
Keyword(s):  
Josephson Junctions ◽  
Critical Currents ◽  
Yttria Stabilized Zirconia ◽  
Step Edge ◽  
Silicon Substrates ◽  
Ion Milling ◽  
Stabilized Zirconia ◽  
Shapiro Steps ◽  
Current Voltage ◽  
Current Voltage Characteristics

AbstractWe have fabricated and tested YBCO step-edge SNS Josephson junctions on silicon substrates. The silicon step edges were patterned photolithographically and reactively ion etched using an SF6 plasma. The structures were fabricated through sequential angled pulsed laser deposition of yttria stabilized zirconia, YBCO, and gold layers, followed by photolithographic patterning and ion milling. The completed devices showed resistively shunted junction (RSJ)-like current voltage characteristics and microwave induced Shapiro steps. Critical currents as large as 84 PA and resistances of order 0.5 Ω were obtained. Measurable critical currents were observed up to 76 K. We report on the fabrication and properties of these junctions.

EFFECT OF THERMAL NOISE ON THE CURRENT-VOLTAGE CHARACTERISTICS OF JOSEPHSON JUNCTIONS

1996 ◽  
Vol 10 (22) ◽  
pp. 1095-1102 ◽  
Author(s):  
A.K. CHATTAH ◽  
C.B. BRIOZZO ◽  
O. OSENDA ◽  
M.O. CÁCERES
Keyword(s):  
Josephson Junctions ◽  
Thermal Noise ◽  
Planck Equation ◽  
Resonance Problem ◽  
Shapiro Steps ◽  
Periodic Distribution ◽  
Current Voltage ◽  
Current Voltage Characteristics ◽  
Path Integral Method ◽  
Asymptotic Time

We analyze the influence of thermal noise on the Shapiro steps appearing in the current-voltage characteristics of Josephson junctions. We solve the Fokker-Planck equation describing the system by a path integral method in the steepest-descent approximation, previously applied to the stochastic resonance problem. We obtain the Asymptotic Time-Periodic Distribution Pas(ϕ, t), where ϕ∈[0, 2π] and compute from it the voltage [Formula: see text], constructing the I-V characteristics. We find a defined “softening” of the Shapiro steps as temperature increases, for values of the system parameters in the experimentally accessible range.

Current-voltage characteristics of interacting Josephson junctions

1980 ◽  
Author(s):  
A. K. Jain ◽  
J. E. Lukens ◽  
Kin Li ◽  
R. D. Sandell ◽  
C. Varmazis
Keyword(s):  
Josephson Junctions ◽  
Current Voltage ◽  
Current Voltage Characteristics
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