Surface roughness investigations of thin film disks used in magnetic recording technology

1992 ◽  
Author(s):  
Min Yang ◽  
Frank E. Talke
Author(s):  
K. Ogura ◽  
H. Nishioka ◽  
N. Ikeo ◽  
T. Kanazawa ◽  
J. Teshima

Structural appraisal of thin film magnetic media is very important because their magnetic characters such as magnetic hysteresis and recording behaviors are drastically altered by the grain structure of the film. However, in general, the surface of thin film magnetic media of magnetic recording disk which is process completed is protected by several-nm thick sputtered carbon. Therefore, high-resolution observation of a cross-sectional plane of a disk is strongly required to see the fine structure of the thin film magnetic media. Additionally, observation of the top protection film is also very important in this field.Recently, several different process-completed magnetic disks were examined with a UHR-SEM, the JEOL JSM 890, which consisted of a field emission gun and a high-performance immerse lens. The disks were cut into approximately 10-mm squares, the bottom of these pieces were carved into more than half of the total thickness of the disks, and they were bent. There were many cracks on the bent disks. When these disks were observed with the UHR-SEM, it was very difficult to observe the fine structure of thin film magnetic media which appeared on the cracks, because of a very heavy contamination on the observing area.


2019 ◽  
Vol 7 (36) ◽  
pp. 20733-20741 ◽  
Author(s):  
Mehri Ghasemi ◽  
Miaoqiang Lyu ◽  
Md Roknuzzaman ◽  
Jung-Ho Yun ◽  
Mengmeng Hao ◽  
...  

The phenethylammonium cation significantly promotes the formation of fully-covered thin-films of hybrid bismuth organohalides with low surface roughness and excellent stability.


1998 ◽  
Vol 51 (1) ◽  
pp. 5-19 ◽  
Author(s):  
S.B. Luitjens ◽  
W. Folkerts ◽  
H.W. Van Kesteren ◽  
J.J.M. Ruigrok

1987 ◽  
Vol 23 (5) ◽  
pp. 3645-3647 ◽  
Author(s):  
V. Novotny ◽  
G. Itnyre ◽  
A. Homola ◽  
L. Franco

2000 ◽  
Vol 36 (1) ◽  
pp. 189-194 ◽  
Author(s):  
Peng Luo ◽  
Sanwu Tan ◽  
H.N. Bertram ◽  
G. Hughes ◽  
F.E. Talke

2014 ◽  
Vol 116 (3) ◽  
pp. 1257-1260 ◽  
Author(s):  
L. Zhang ◽  
S.-X. Xue ◽  
Z.-G. Li ◽  
Y.-P. Liu ◽  
W.-P. Chen

2002 ◽  
Vol 721 ◽  
Author(s):  
Bo Cheng ◽  
Kun Yang ◽  
B. L. Justus ◽  
W. J. Yeh

AbstractIn magnetic recording technology, barriers based on fundamental physical limits on the data density are being approached for the current longitudinal recording modes. However, demands for higher data storage density have escalated in recent years. Discrete perpendicular recording is a viable method to achieve 100 Gb per square inch and beyond. We report on the development of a novel technique to fabricate uniform arrays of nano-sized magnetic dots. Uniform arrays of nanometer-sized magnetic dots are obtained by magnetron sputtering deposition through a nanochannel glass replica mask. The platinum replica masks are fabricated using thin film deposition on etched nanochannel glass and contain uniform hexagonally patterned voids with diameters as small as 50 nanometers. The magnetic dot density can be as high as 1011 per square inch. Our method provides a simple yet effective way to create regularly arranged discrete magnetic media that can be used for perpendicular magnetic recording. The magnetic properties of the dots are studied with a vibrating sample magnetometer.


Sign in / Sign up

Export Citation Format

Share Document