Thin film thermocouple sensors for measurement of contact temperatures during slider asperity interaction on magnetic recording disks

1992 ◽  
Vol 28 (5) ◽  
pp. 2548-2550 ◽  
Author(s):  
E. Schreck ◽  
R.E. Fontana ◽  
G.P. Singh
Keyword(s):  
Thin Film ◽  
Magnetic Recording ◽  
Thin Film Thermocouple

High-resolution scanning electron microscopy of thin-film magnetic media of magnetic recording disk

1992 ◽  
Vol 50 (2) ◽  
pp. 1334-1335
Author(s):  
K. Ogura ◽  
H. Nishioka ◽  
N. Ikeo ◽  
T. Kanazawa ◽  
J. Teshima
Keyword(s):  
Thin Film ◽  
Fine Structure ◽  
High Resolution ◽  
Magnetic Recording ◽  
High Performance ◽  
Magnetic Hysteresis ◽  
Grain Structure ◽  
Magnetic Media ◽  
Cross Sectional ◽  
Resolution Observation

Structural appraisal of thin film magnetic media is very important because their magnetic characters such as magnetic hysteresis and recording behaviors are drastically altered by the grain structure of the film. However, in general, the surface of thin film magnetic media of magnetic recording disk which is process completed is protected by several-nm thick sputtered carbon. Therefore, high-resolution observation of a cross-sectional plane of a disk is strongly required to see the fine structure of the thin film magnetic media. Additionally, observation of the top protection film is also very important in this field.Recently, several different process-completed magnetic disks were examined with a UHR-SEM, the JEOL JSM 890, which consisted of a field emission gun and a high-performance immerse lens. The disks were cut into approximately 10-mm squares, the bottom of these pieces were carved into more than half of the total thickness of the disks, and they were bent. There were many cracks on the bent disks. When these disks were observed with the UHR-SEM, it was very difficult to observe the fine structure of thin film magnetic media which appeared on the cracks, because of a very heavy contamination on the observing area.

A New Scanning Thermal Microprobe

1997 ◽  
Vol 503 ◽  
Author(s):  
Yongxia Zhang ◽  
Yanwei Zhang ◽  
Juliana Blaser ◽  
T. S. Sriiram ◽  
R. B. Marcus
Keyword(s):  
Thin Film ◽  
High Resolution ◽  
Thermal Response ◽  
Temperature Sensing ◽  
Thermal Sensor ◽  
Atomic Force ◽  
Thin Film Thermocouple ◽  
Processing Steps ◽  
Thermocouple Junction

ABSTRACTA thermal microprobe has been designed and built for high resolution temperature sensing. The thermal sensor is a thin-film thermocouple junction at the tip of an Atomic Force Microprobe (AFM) silicon probe needle. Only wafer-stage processing steps are used for the fabrication. The thermal response over the range 25–s 4.5–rovolts per degree C and is linear.

Trends in digital magnetic recording; the application of thin-film heads for tape recording

1998 ◽  
Vol 51 (1) ◽  
pp. 5-19 ◽  
Author(s):  
S.B. Luitjens ◽  
W. Folkerts ◽  
H.W. Van Kesteren ◽  
J.J.M. Ruigrok
Keyword(s):  
Thin Film ◽  
Magnetic Recording ◽  
Tape Recording

Corrosion of thin film cobalt based magnetic recording media

1987 ◽  
Vol 23 (5) ◽  
pp. 3645-3647 ◽  
Author(s):  
V. Novotny ◽  
G. Itnyre ◽  
A. Homola ◽  
L. Franco
Keyword(s):  
Thin Film ◽  
Magnetic Recording ◽  
Recording Media ◽  
Magnetic Recording Media

FePt-C granular thin film for heat-assisted magnetic recording (HAMR) media

2014 ◽  
Vol 116 (3) ◽  
pp. 1257-1260 ◽  
Author(s):  
L. Zhang ◽  
S.-X. Xue ◽  
Z.-G. Li ◽  
Y.-P. Liu ◽  
W.-P. Chen
Keyword(s):  
Thin Film ◽  
Magnetic Recording ◽  
Heat Assisted Magnetic Recording

Peltier effect in a co-evaporated Sb2Te3(P)-Bi2Te3(N) thin film thermocouple

2002 ◽  
Vol 408 (1-2) ◽  
pp. 270-274 ◽  
Author(s):  
Helin Zou ◽  
D.M. Rowe ◽  
S.G.K. Williams
Keyword(s):  
Thin Film ◽  
Peltier Effect ◽  
Thin Film Thermocouple
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