Electrogravimetric and stress measurements of ion intercalation in NiO x thin films

1992 ◽  
Author(s):  
I. C. de Faria ◽  
R. M. Torresi ◽  
Annette Gorenstein
Keyword(s):  
Thin Films ◽  
Stress Measurements ◽  
Ion Intercalation

In Situ Measurement of Stresses in Thin Films

1991 ◽  
Vol 239 ◽  
Author(s):  
Reinhard Abermann
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Gas Adsorption ◽  
Gas Diffusion ◽  
Island Growth ◽  
Stress Measurements ◽  
Growth Modes ◽  
Columnar Grain ◽  
Selection Of

ABSTRACTIn this paper the results of experiments are summarized in which the internal stress (i.e. force per unit width) of thin films was measured in situ under UHV conditions with a bending beam apparatus. It is demonstrated that characteristic types of stress vs. thickness curves can be correlated with different growth modes (i.e. columnar grain growth and island growth) caused by differences in the adatom mobility of the deposited material. With a selection of thin film systems it is then shown that stress measurements can be used to study the effect of gas incorporation, of gas diffusion from the substrate, of reaction with the substrate and of the substrate temperature on the growth and structure of a thin film. Finally it will be demonstrated that stress measurements can even be used to study gas adsorption on vapor deposited films.

scholarly journals Electrochromic Devices Based on Porous Tungsten Oxide Thin Films

2012 ◽  
Vol 2012 ◽  
pp. 1-9 ◽  
Author(s):  
Y. Djaoued ◽  
S. Balaji ◽  
R. Brüning
Keyword(s):  
Thin Films ◽  
Transition Metal Oxides ◽  
Structural Phase ◽  
Phase Changes ◽  
Optical Modulation ◽  
Electrochromic Devices ◽  
Smart Windows ◽  
Porous Thin Films ◽  
Recent Developments ◽  
Ion Intercalation

Recent developments in the synthesis of transition metal oxides in the form of porous thin films have opened up opportunities in the construction of electrochromic devices with enhanced properties. In this paper, synthesis, characterization and electrochromic applications of porous WO3thin films with different nanocrystalline phases, such as hexagonal, monoclinic, and orthorhombic, are presented. Asymmetric electrochromic devices have been constructed based on these porous WO3thin films. XRD measurements of the intercalation/deintercalation of Li+into/from the WO3layer of the device as a function of applied coloration/bleaching voltages show systematic changes in the lattice parameters associated with structural phase transitions in LixWO3. Micro-Raman studies show systematic crystalline phase changes in the spectra of WO3layers during Li+ion intercalation and deintercalation, which agree with the XRD data. These devices exhibit interesting optical modulation (up to ~70%) due to intercalation/deintercalation of Li ions into/from the WO3layer of the devices as a function of applied coloration/bleaching voltages. The obtained optical modulation of the electrochromic devices indicates that, they are suitable for applications in electrochromic smart windows.

Li-Ion Intercalation in Thermal Oxide Thin Films of MoO3as Studied by XPS, RBS, and NRA

2008 ◽  
Vol 112 (29) ◽  
pp. 11050-11058 ◽  
Author(s):  
Jolanta Światowska-Mrowiecka ◽  
Soline de Diesbach ◽  
Vincent Maurice ◽  
Sandrine Zanna ◽  
Lorena Klein ◽  
...  
Keyword(s):  
Thin Films ◽  
Oxide Thin Films ◽  
Thermal Oxide ◽  
Li Ion ◽  
Ion Intercalation
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