Measurement of physical thicknesses in micromachined structures consisting of glass and c-Si, by Fourier transform infrared reflection
2002 ◽
Vol 106
(24)
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pp. 6234-6247
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1983 ◽
Vol 30
(1)
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pp. 43-50
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Keyword(s):
1984 ◽
Vol 88
(7)
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pp. 1275-1277
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1990 ◽
Vol 175
(3)
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pp. 237-243
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Keyword(s):
1993 ◽
Vol 11
(4)
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pp. 1957-1963
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1991 ◽
Vol 94
(9)
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pp. 6256-6263
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2000 ◽
Vol 12
(16)
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pp. 3897-3900
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