Analysis of the optical properties and structure of serial bi-deposited TiO2 chiral sculptured thin films using Mueller matrix ellipsometry
2011 ◽
Vol 257
(21)
◽
pp. 9044-9055
◽
2008 ◽
Vol 25
(6)
◽
pp. 2181-2184
◽
2017 ◽
Vol 393
◽
pp. 234-255
◽
2017 ◽
Vol 421
◽
pp. 513-517
◽
2008 ◽
Vol 255
(5)
◽
pp. 2192-2195
◽
Keyword(s):