Effect of evaporation behavior of zinc tin phosphide alloys on the composition, structure, and photoconductive properties of their thin films

2020 ◽  
Vol 38 (6) ◽  
pp. 063404
Author(s):  
P. Sivakumar ◽  
P. Peranantham ◽  
V. V. Siva Kumar ◽  
K. Asokan ◽  
Y. L. Jeyachandran
Keyword(s):  
Thin Films ◽  
Composition Structure ◽  
Tin Phosphide

High textured AlN thin films grown by RF magnetron sputtering; composition, structure, morphology and hardness

Vacuum ◽  
2004 ◽  
Vol 75 (4) ◽  
pp. 331-338 ◽  
Author(s):  
I.C Oliveira ◽  
K.G Grigorov ◽  
H.S Maciel ◽  
M Massi ◽  
C Otani
Keyword(s):  
Thin Films ◽  
Magnetron Sputtering ◽  
Rf Magnetron Sputtering ◽  
Structure Morphology ◽  
Composition Structure

Structure, Electrical and Magnetic Properties of Thin Films of La1−xMxMnO3 on Si

1999 ◽  
Vol 562 ◽  
Author(s):  
N. N. Mateeva ◽  
P. C. Hogan ◽  
K. H. Dahmen
Keyword(s):  
Thin Films ◽  
Magnetic Properties ◽  
Transition Temperature ◽  
Buffer Layers ◽  
Ferromagnetic Transition ◽  
Electrical And Magnetic Properties ◽  
Insulator Metal Transition ◽  
Composition Structure

ABSTRACTThin films of lanthanum manganates doped with Ca2+, Sr2+, Ba2+ and Pb2+ have been deposited on Si(100) substrate and their electrical and magnetic properties were discussed with respect to the composition, structure and nature of the dopant. Buffer layers of YSZ and La0.8Al0.2O3 were employed and their effect on the materials was studied. Interesting magnetotransport properties were found in some of the films, where there is a large difference between the insulator-metal transition temperature and a ferromagnetic transition temperature.

Optimal Preparation and Characterization of Sputtered Y2O3 Films on Sapphire Substrates

2014 ◽  
Vol 602-603 ◽  
pp. 266-269 ◽  
Author(s):  
Gui Gen Wang ◽  
Hong Liang Qian ◽  
Qing Tao Li ◽  
Guo Shuang Qin ◽  
Lin Luo
Keyword(s):  
Thin Films ◽  
Refractive Index ◽  
Deposition Velocity ◽  
Rf Power ◽  
Sapphire Substrates ◽  
Elastic Module ◽  
Preparation Conditions ◽  
Composition Structure ◽  
Sputtering Pressure

Normal 0 7.8 磅 0 2 false false false MicrosoftInternetExplorer4 It is necessary to prepare compressive films on sapphire window for preventing its high-temperature failure. In this study, the yttrium oxide (Y2O3) thin films were deposited on the sapphire substrates by RF reactive magnetron sputtering with varying sputtering pressure. The as-deposited Y2O3films were also annealed. The composition, structure, refractive index and mechanical properties of the films were systematically analyzed by XPS, XRD, ellipsometry and nanoindention method, respectively. The influences of sputtering pressure on the deposition velocity and the refractive index were investigated. It can obtain desirable Y2O3thin films for the preparation conditions (sputtering pressure: 10Pa, substrate temperature: 500°C, RF power: 200W) after annealing in O2at 500°C for 1h. The refractive index and hardness both have the maximum value (1.8337 and 3.98 GPa), respectively. The elastic module has the minimum value (109.24 GPa). It is promising for the Y2O3film as the underlayer of protective coating of sapphire windows. <object classid="clsid:38481807-CA0E-42D2-BF39-B33AF135CC4D" id=ieooui> st1\:*{behavior:url(#ieooui) } /* Style Definitions */ table.MsoNormalTable {mso-style-name:普通表格; mso-tstyle-rowband-size:0; mso-tstyle-colband-size:0; mso-style-noshow:yes; mso-style-parent:""; mso-padding-alt:0pt 5.4pt 0pt 5.4pt; mso-para-margin:0pt; mso-para-margin-bottom:.0001pt; mso-pagination:widow-orphan; font-size:10.0pt; font-family:"Times New Roman"; mso-fareast-font-family:"Times New Roman"; mso-ansi-language:#0400; mso-fareast-language:#0400; mso-bidi-language:#0400;}

Effect of annealing on composition, structure and optical properties of SrHfON thin films

2012 ◽  
Vol 258 (24) ◽  
pp. 9706-9710 ◽  
Author(s):  
Li-ping Feng ◽  
Yin-quan Wang ◽  
Hao Tian ◽  
Zheng-tang Liu
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Composition Structure

Composition, Structure, Morphology of thin Films Produced by Hydrochemical Deposition in PbSe-CdSe System

2015 ◽  
Vol 3 (1) ◽  
pp. 56-68
Author(s):  
Nina V. Zarubina ◽  
◽  
Ivan V. Zarubin ◽  
Larisa N. Maskaeva ◽  
Vyacheslav F. Markov
Keyword(s):  
Thin Films ◽  
Hydrochemical Deposition ◽  
Structure Morphology ◽  
Composition Structure

The Influence of Deposition Conditions on the Properties of a-Sic:H Thin Films

1990 ◽  
Vol 192 ◽  
Author(s):  
L. Magafas ◽  
D. Girginoudi ◽  
N. Georgoulas ◽  
A. Thanailakis
Keyword(s):  
Thin Films ◽  
Chemical Composition ◽  
Optical Absorption ◽  
Flow Rate ◽  
Growth Conditions ◽  
Optical Absorption Coefficient ◽  
Hydrogen Flow Rate ◽  
Hydrogen Flow ◽  
Composition Structure ◽  
Deposition Conditions

ABSTRACTThe dependence of chemical composition, structure and optoelectronic properties of sputtered a-SiC:H thin films on substrate temperature, Ts, and hydrogen flow rate has been studied. The films are amorphous for the growth conditions used in this work. The chemical composition of the alloys is very little influenced by the Ts, whereas the hydrogen content and the optical absorption coefficient depends strongly on Ts and hydrogen flow rate.

PLD Grown 3C-SiC Thin Films on Si: Morphology and Structure

2015 ◽  
Vol 821-823 ◽  
pp. 213-216
Author(s):  
S.M. Ryndya ◽  
N.I. Kargin ◽  
A.S. Gusev ◽  
E.P. Pavlova
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Rutherford Backscattering Spectrometry ◽  
X Ray Diffraction ◽  
Force Microscopy ◽  
Selected Area Electron Diffraction ◽  
Atomic Force ◽  
Transmission Electron ◽  
Influence Of Substrate ◽  
Composition Structure

Silicon carbide thin films were obtained on Si (100) and (111) substrates by means of vacuum laser ablation of α-SiC ceramic target. The influence of substrate temperature on composition, structure and surface morphology of experimental samples was examined using Rutherford backscattering spectrometry (RBS), Fourier transform infrared spectroscopy (FTIR), scanning electron microscopy (SEM), conventional and high-resolution transmission electron microscopy (TEM/HRTEM), atomic force microscopy (AFM), selected area electron diffraction (SAED) and X-ray diffraction (XRD) methods.

Correlating the Local Electrocatalytic Activity of Amorphous Molybdenum Sulfide Thin Films with Microscopic Composition, Structure, and Porosity

2020 ◽  
Vol 12 (39) ◽  
pp. 44307-44316
Author(s):  
Cameron L. Bentley ◽  
Roland Agoston ◽  
Binglin Tao ◽  
Marc Walker ◽  
Xiangdong Xu ◽  
...  
Keyword(s):  
Thin Films ◽  
Electrocatalytic Activity ◽  
Molybdenum Sulfide ◽  
Composition Structure
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