Development of two-color resonant ionization sputtered neutral mass spectrometry and microarea imaging for Sr

2020 ◽  
Vol 38 (4) ◽  
pp. 044001 ◽  
Author(s):  
Yue Zhao ◽  
Takeru Yoshida ◽  
Yuzuka Ohmori ◽  
Yuta Miyashita ◽  
Masato Morita ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Resonant Ionization

Resonant ionization mass spectrometry of ammonia

1998 ◽  
Author(s):  
Titaina Gibert-Legrand ◽  
Thierry Gonthiez ◽  
Laurent Vivet ◽  
Pascal Brault
Keyword(s):  
Mass Spectrometry ◽  
Ionization Mass Spectrometry ◽  
Ionization Mass ◽  
Resonant Ionization

Prediction and Identification of Multiple-Photon Resonant Ionization Processes

1988 ◽  
Vol 42 (6) ◽  
pp. 1057-1061 ◽  
Author(s):  
D. H. Smith ◽  
H. S. McKown ◽  
J. P. Young ◽  
R. W. Shaw ◽  
D. L. Donohue
Keyword(s):  
Mass Spectrometry ◽  
Energy Levels ◽  
Computer Code ◽  
Ionization Mass Spectrometry ◽  
Resonance Ionization ◽  
Ionization Mass ◽  
Resonance Ionization Mass Spectrometry ◽  
Resonant Ionization ◽  
Ionization Processes ◽  
Actinide Elements

Many single-color, multiple-photon transitions leading to ionization are observed for lanthanide and actinide elements in experiments using resonance ionization mass spectrometry (RIMS). It is desirable both to identify the energy levels involved in observed transitions and to be able to predict in advance their location. A computer code, ETRANS, has been written to perform these functions. Examples of both types of operation are given.

Ion Microscopy with Resonant Ionization Mass Spectrometry: Time-of-Flight Depth Profiling with Improved Isotopic Precision

2010 ◽  
Vol 16 (3) ◽  
pp. 373-377 ◽  
Author(s):  
Michael J. Pellin ◽  
Igor V. Veryovkin ◽  
Jonathan Levine ◽  
Alexander Zinovev ◽  
Andrew M. Davis ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Time Of Flight ◽  
Depth Profiling ◽  
Ionization Mass Spectrometry ◽  
Ionization Mass ◽  
Resonant Ionization ◽  
Ion Microscopy

Determination of trace elements by resonant ionization mass spectrometry (RIMS)

1988 ◽  
Vol 331 (2) ◽  
pp. 182-185 ◽  
Author(s):  
W. Ruster ◽  
F. Ames ◽  
M. Mang ◽  
C. M�hleck ◽  
D. Rehklau ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Trace Elements ◽  
Ionization Mass Spectrometry ◽  
Ionization Mass ◽  
Resonant Ionization

Development of laser ablation assisted resonant ionization mass spectrometry for isotope analysis

2010 ◽  
Vol 196 (1-3) ◽  
pp. 169-176 ◽  
Author(s):  
Hideki Tomita ◽  
Christoph Mattolat ◽  
Sebastian Raeder ◽  
Seiji Sasada ◽  
Yuki Higuchi ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Laser Ablation ◽  
Isotope Analysis ◽  
Ionization Mass Spectrometry ◽  
Ionization Mass ◽  
Resonant Ionization

Ultratrace analysis of krypton isotopes by resonant ionization spectroscopy-time of flight mass spectrometry (RIS-TOF)

2016 ◽  
Vol 31 (4) ◽  
pp. 994-1001 ◽  
Author(s):  
Eric Gilabert ◽  
Bernard Lavielle ◽  
Bertrand Thomas ◽  
Sylvain Topin ◽  
Fabien Pointurier ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Time Of Flight ◽  
High Sensitivity ◽  
Isotope Ratios ◽  
Ultratrace Analysis ◽  
Resonant Ionization ◽  
Flight Mass Spectrometry

A new RIS-TOF instrument, called FAKIR (Facility for Analyzing Krypton Isotope Ratios), has been developed at CENBG in order to measure Kr isotope ratios with an extremely high sensitivity.

Secondary neutral mass spectrometry using three-colour resonance ionization: osmium detection at the p.p.b. level and iron detection in silicon at the < 200 p.p.t. level

1990 ◽  
Vol 333 (1628) ◽  
pp. 133-146 ◽  
Keyword(s):  
Mass Spectrometry ◽  
Chemical Separation ◽  
Mass Resolution ◽  
Detection Sensitivity ◽  
Resonance Ionization ◽  
Spectrometric Analysis ◽  
Near Surface ◽  
Impurity Atoms ◽  
Resonant Ionization ◽  
Useful Yield

Among the many uses of resonantly enhanced multiphoton ionization (REMPI) spectroscopy, secondary neutral mass spectrometry (SNMS) is both one of the most demanding and one of the most important. Recently, we have demonstrated that the selectivity of REMPI, and thus the sensitivity of SNMS, can be greatly enhanced by using resonant excitation schemes involving multiple resonant processes. Of particular interest is the use of autoionizing resonances, resonances with energies in excess of the ionization potential of the atom, in the REMPI process. The use of autoionizing resonances can reduce the laser intensity required to saturate the ionization process by more than an order of magnitude. This reduction can strongly reduce non-resonant ionization of background constituents, enhancing the signal to noise of the snms measurement. Although this approach to laser ionization SNMS is generally applicable, the three-colour ionization method has been demonstrated using two widely disparate yet important systems. Iron impurity atoms form deep level traps in Si, changing bulk electrical properties even at concentrations approaching 1 p.p.t. In this case, normal mass spectrometry of impurity atoms is complicated by the isobaric interference of 56 Fe and 28 Si 2 molecule. The required mass resolution of greater than 10 4 exceeds the capabilities of most mass spectrometers. Even for instruments with sufficient mass resolution, the concomitant reduction in useful yield limits detection sensitivity in the near-surface region to 1 p.p.m. REMPI has now been successfully used to separately ionize the impurity atoms of interest. Three-colour REMPI dramatically reduces the residual non-resonant ionization of the isobarically interfering ion, allowing SNMS measurements at levels below 100 p.p.t. This result is accomplished without significant reduction in the fraction of contaminant atoms ionized and, therefore, in useful yield. Mass spectrometric analysis for Os and Re has long been recognized as an important analytical goal in geochemistry. The concentrations and isotopic compositions of these elements must be determined in order to utilize the radioactive decay of 187 Re to 187 Os ( 4.23 x 10 10 years) as a tracer of geochemical processes. Three problems have limited the analysis of Os and Re. First, the concentrations of Os and Re in naturally occurring samples are extremely low, ranging from 1 p.p.b. to 60 p.p.m. Second, the high-ionization potentials (ip) of Os (8.7 eV) and Re (7.9 eV) have precluded the use of thermal ionization and limited the sensitivity of secondary ion mass spectrometry (sims) measurement to parts per million. Finally, the 187 R e/ 187 Os mass difference is less than 1 p.p.m., making conventional mass analysis (without complex chemical separation) impossible. We have demonstrated the ability of three-colour resonant SNMS to detect and separate Os and Re in Ni samples at the 4 p.p.b. level. In situ analysis of Os in iron meteorites demonstrates an elemental selectivity of Os over Re of greater than 10 3 without prior chemical separation. Measurements on a suite of samples with Os concentration varying from 10%o down to 100 p.p.b. show a linear correlation between concentration and signal with a precision of better than + 13% and a useful yield in excess of 1 %. These results demonstrate the potential for three-colour resonant ionization to detect and selectively ionize most high IP elements, including all of the Pt group elements, with good sensitivity, accuracy, and precision.

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