Novel scanning near-field optical microscopy/atomic force microscope probes by combined micromachining and electron-beam nanolithography

1999 ◽  
Vol 17 (5) ◽  
pp. 1954 ◽  
Author(s):  
H. Zhou ◽  
A. Midha ◽  
L. Bruchhaus ◽  
G. Mills ◽  
L. Donaldson ◽  
...  
Keyword(s):  
Electron Beam ◽  
Atomic Force Microscope ◽  
Optical Microscopy ◽  
Near Field ◽  
Atomic Force

Heat Transfer Spectroscopy and “Heat Transfer-Distance” Curves

2008 ◽  
Author(s):  
Arvind Narayanaswamy ◽  
Sheng Shen ◽  
Gang Chen
Keyword(s):  
Heat Transfer ◽  
Radiative Transfer ◽  
Atomic Force Microscope ◽  
Near Field ◽  
Surface Force ◽  
Casimir Forces ◽  
Distance Curve ◽  
Transfer Distance ◽  
Atomic Force ◽  
Order Of Magnitude

Thermal radiative transfer between objects as well as near-field forces such as van der Waals or Casimir forces have their origins in the fluctuations of the electrodynamic field. Near-field radiative transfer between two objects can be enhanced by a few order of magnitude compared to the far-field radiative transfer that can be described by Planck’s theory of blackbody radiation and Kirchoff’s laws. Despite this common origin, experimental techniques of measuring near-field forces (using the surface force apparatus and the atomic force microscope) are more sophisticated than techniques of measuring near-field radiative transfer. In this work, we present an ultra-sensitive experimental technique of measuring near-field using a bi-material atomic force microscope cantilever as the thermal sensor. Just as measurements of near-field forces results in a “force distance curve”, measurement of near-field radiative transfer results in a “heat transfer-distance” curve. Results from the measurement of near-field radiative transfer will be presented.

Advancement in fabrication of carbon nanotube tip for atomic force microscope using multi-axis nanomanipulator in scanning electron microscope

2022 ◽  
Author(s):  
Sanjeev Kumar Kanth ◽  
Anjli Sharma ◽  
Byong Chon Park ◽  
Woon Song ◽  
Hyun Rhu ◽  
...  
Keyword(s):  
Electron Beam ◽  
Electron Microscope ◽  
Carbon Nanotube ◽  
Scanning Electron Microscope ◽  
Atomic Force Microscope ◽  
Structural Integrity ◽  
Ion Beam ◽  
Rectilinear Motion ◽  
Atomic Force ◽  
Scanning Electron

Abstract We have constructed a new nanomanipulator (NM) in a field emission scanning electron microscope (FE-SEM) to fabricate carbon nanotube (CNT) tip to precisely adjust the length and attachment angle of CNT onto the mother atomic force microscope (AFM) tip. The new NM is composed of 2 modules, each of which has the degree of freedom of three-dimensional rectilinear motion x, y and z and one-dimensional rotational motion θ. The NM is mounted on the stage of a FE-SEM. With the system of 14 axes in total which includes 5 axes of FE-SEM and 9 axes of nano-actuators, it was possible to see CNT tip from both rear and side view about the mother tip. With the help of new NM, the attachment angle error could be reduced down to 0º as seen from both the side and the rear view, as well as, the length of the CNT could be adjusted with the precision using electron beam induced etching. For the proper attachment of CNT on the mother tip surface, the side of the mother tip was milled with focused ion beam. In addition, electron beam induced deposition was used to strengthen the adhesion between CNT and the mother tip. In order to check the structural integrity of fabricated CNT, transmission electron microscope image was taken which showed the fine cutting of CNT and the clean surface as well. Finally, the performance of the fabricated CNT tip was demonstrated by imaging 1-D grating and DNA samples with atomic force microscope in tapping mode.

scholarly journals Mapping electron-beam-injected trapped charge with scattering scanning near-field optical microscopy

2016 ◽  
Vol 41 (5) ◽  
pp. 1046 ◽  
Author(s):  
Denis E. Tranca ◽  
Emilio Sánchez-Ortiga ◽  
Genaro Saavedra ◽  
Manuel Martínez-Corral ◽  
Syed A. M. Tofail ◽  
...  
Keyword(s):  
Electron Beam ◽  
Optical Microscopy ◽  
Near Field ◽  
Trapped Charge

scholarly journals Grating Metamaterials Based on CdTe/CdMgTe Quantum Wells as Terahertz Detectors for High Magnetic Field Applications

2020 ◽  
Vol 10 (8) ◽  
pp. 2807
Author(s):  
Dmitriy Yavorskiy ◽  
Maria Szoła ◽  
Krzysztof Karpierz ◽  
Rafał Bożek ◽  
Rafał Rudniewski ◽  
...  
Keyword(s):  
Magnetic Field ◽  
Electron Beam ◽  
Quantum Well ◽  
Quantum Wells ◽  
Atomic Force Microscope ◽  
High Magnetic Field ◽  
White Light ◽  
Electron Beam Lithography ◽  
Terahertz Detectors ◽  
Atomic Force

The cyclotron and magnetoplasmon resonances were studied at 2 K in grating metamaterials fabricated on wafers with one or two modulation doped CdTe/CdMgTe quantum wells. The gratings (with the period varied between 2 μ m and 8 μ m) were prepared with an electron beam lithography either by etching or by evaporation of Au. The gratings were studied with an atomic force microscope which revealed a correlation between the depth and width of etched grooves at a constant time of etching. The sharpest resonances observed are due to excitation of magnetoplasmon in the case of Au gratings on a wafer with one quantum well. Etched samples with two quantum wells showed the strongest tuneability of magnetoplasmon resonances with the period of the grating and illumination with white light. We showed that the samples studied can be used as resonant or quasi-resonant terahertz detectors tuneable with magnetic field and white light.

Scanning Near-Field Optical Microscope Study of Ag Nanoprotrusions Fabricated by Nano-oxidation with Atomic Force Microscope

2003 ◽  
Vol 42 (Part 1, No. 12) ◽  
pp. 7635-7639 ◽  
Author(s):  
JunHo Kim ◽  
Jeongyong Kim ◽  
K.-B. Song ◽  
S.-Q. Lee ◽  
E.-K. Kim ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Microscope Study ◽  
Near Field ◽  
Optical Microscope ◽  
Atomic Force

Development of a “Built-in” Scanning Near Field Microscope Head for an Atomic Force Microscope System and Stress Mapping of an Al2O3/ZrO2 Eutectic Composite

2006 ◽  
Vol 13 (4) ◽  
pp. 269-275 ◽  
Author(s):  
Tatsuo Nakagawa ◽  
Satoshi Fukura ◽  
Munenori Nakai ◽  
Kazumasa Sugiyama ◽  
Ryohei Kokawa ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Near Field ◽  
Eutectic Composite ◽  
Atomic Force ◽  
Stress Mapping

Near-field optical and atomic force constraints for superresolution 3D deconvolution in far-field optical microscopy

2000 ◽  
Author(s):  
Noel Axelrod ◽  
Anna Radko ◽  
Nissim Ben-Yosef ◽  
Artium Khatchatouriants ◽  
Millet Treinin ◽  
...  
Keyword(s):  
Optical Microscopy ◽  
Near Field ◽  
Far Field ◽  
Atomic Force
Sign in / Sign up

Export Citation Format

Share Document