In situ reflectance difference spectroscopy of II–VI compounds: A real time study of N plasma doping during molecular beam epitaxy
1999 ◽
Vol 17
(4)
◽
pp. 1697
◽
2000 ◽
Vol 18
(4)
◽
pp. 2224
◽
1999 ◽
Vol 201-202
◽
pp. 132-136
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2008 ◽
Vol 26
(3)
◽
pp. 1049
◽
Keyword(s):
1992 ◽
Vol 60-61
◽
pp. 534-543
◽
2007 ◽
Vol 25
(4)
◽
pp. 1398
2017 ◽
Vol 26
(6)
◽
pp. 214-217
Keyword(s):
Application of reflectance difference spectroscopy to molecular‐beam epitaxy growth of GaAs and AlAs
1988 ◽
Vol 6
(3)
◽
pp. 1327-1332
◽