Current oscillations in thin metal–oxide–semiconductor structures observed by ballistic electron emission microscopy

1998 ◽  
Vol 16 (4) ◽  
pp. 2296 ◽  
Author(s):  
H. J. Wen
Keyword(s):  
Metal Oxide ◽  
Electron Emission ◽  
Metal Oxide Semiconductor ◽  
Thin Metal ◽  
Oxide Semiconductor ◽  
Ballistic Electron Emission Microscopy ◽  
Semiconductor Structures ◽  
Ballistic Electron ◽  
Current Oscillations ◽  
Emission Microscopy

Imaging Hot-Electron Emission from Metal-Oxide-Semiconductor Structures

1996 ◽  
Vol 76 (17) ◽  
pp. 3200-3203 ◽  
Author(s):  
Marián Maňkoš ◽  
R. M. Tromp ◽  
M. C. Reuter ◽  
E. Cartier
Keyword(s):  
Metal Oxide ◽  
Electron Emission ◽  
Metal Oxide Semiconductor ◽  
Oxide Semiconductor ◽  
Hot Electron ◽  
Semiconductor Structures

Interface/border trap characterization of Al2O3/AlN/GaN metal-oxide-semiconductor structures with an AlN interfacial layer

2015 ◽  
Vol 106 (5) ◽  
pp. 051605 ◽  
Author(s):  
Shenghou Liu ◽  
Shu Yang ◽  
Zhikai Tang ◽  
Qimeng Jiang ◽  
Cheng Liu ◽  
...  
Keyword(s):  
Metal Oxide ◽  
Interfacial Layer ◽  
Metal Oxide Semiconductor ◽  
Oxide Semiconductor ◽  
Semiconductor Structures

scholarly journals Theory of ballistic electron emission microscopy

2001 ◽  
Vol 66 (1-2) ◽  
pp. 3-51 ◽  
Author(s):  
P.L. de Andres ◽  
F.J. Garcia-Vidal ◽  
K. Reuter ◽  
F. Flores
Keyword(s):  
Electron Emission ◽  
Ballistic Electron Emission Microscopy ◽  
Ballistic Electron ◽  
Emission Microscopy
Sign in / Sign up

Export Citation Format

Share Document