Analysis and optimization of force sensitivity in atomic force microscopy using optical and electrical detection

1998 ◽  
Vol 16 (1) ◽  
pp. 43 ◽  
Author(s):  
Francis Ho
Keyword(s):  
Atomic Force Microscopy ◽  
Electrical Detection ◽  
Force Microscopy ◽  
Force Sensitivity ◽  
Atomic Force

High force sensitivity in Q-controlled phase-modulation atomic force microscopy

2010 ◽  
Vol 97 (1) ◽  
pp. 011906 ◽  
Author(s):  
Naritaka Kobayashi ◽  
Yan Jun Li ◽  
Yoshitaka Naitoh ◽  
Masami Kageshima ◽  
Yasuhiro Sugawara
Keyword(s):  
Atomic Force Microscopy ◽  
Phase Modulation ◽  
Force Microscopy ◽  
Force Sensitivity ◽  
Atomic Force

Optimization of force sensitivity inQ-controlled amplitude-modulation atomic force microscopy

2013 ◽  
Vol 114 (5) ◽  
pp. 054302 ◽  
Author(s):  
Jongwoo Kim ◽  
Baekman Sung ◽  
Byung I. Kim ◽  
Wonho Jhe
Keyword(s):  
Atomic Force Microscopy ◽  
Amplitude Modulation ◽  
Force Microscopy ◽  
Force Sensitivity ◽  
Atomic Force

Electrostatic Forces on the Surface of Metals as Measured by Atomic Force Microscopy

2000 ◽  
Vol 10 (1-2) ◽  
pp. 15
Author(s):  
Eugene Sprague ◽  
Julio C. Palmaz ◽  
Cristina Simon ◽  
Aaron Watson
Keyword(s):  
Atomic Force Microscopy ◽  
Electrostatic Forces ◽  
Force Microscopy ◽  
Atomic Force
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