scholarly journals Enhanced quality factors and force sensitivity by attaching magnetic beads to cantilevers for atomic force microscopy in liquid

2012 ◽  
Vol 112 (11) ◽  
pp. 114324 ◽  
Author(s):  
Sebastian Hoof ◽  
Nitya Nand Gosvami ◽  
Bart W. Hoogenboom
Keyword(s):  
Atomic Force Microscopy ◽  
Magnetic Beads ◽  
Quality Factors ◽  
Force Microscopy ◽  
Force Sensitivity ◽  
Atomic Force

Compositional Mapping in Dynamic Atomic Force Microscopy in High-Q vs. Low-Q Environments: Effects of Cantilever Nonlinear Dynamics

2010 ◽  
Author(s):  
John Melcher ◽  
Arvind Raman
Keyword(s):  
Nonlinear Dynamics ◽  
Atomic Force Microscopy ◽  
Quality Factors ◽  
Force Microscopy ◽  
High Q ◽  
New Class ◽  
Atomic Force ◽  
Nanoscale Metrology ◽  
Q Factors ◽  
Local Stiffness

The ability to simultaneously map variations in topography and composition (local stiffness, adhesion, charge, hydrophillicity/phobicity, viscoelasticity) of samples in ambient and liquid environments has made dynamic atomic force microscopy (dAFM) a powerful tool for nanoscale metrology. In ambient and vacuum environments, quality factors (Q-factors) of the fundamental resonance are typically large, and the contrast channels in dAFM are relatively well understood. In liquid environments, however, Q-factors are typically low due to cantilever interactions with the surrounding viscous liquid, which introduces a new class of nonlinear dynamics that is accompanied by new contrast channels, such as, higher harmonic amplitudes and phases. In particular, we find that the interpretation of the traditional contrast channels is quite different in low-Q environments compared to high-Q environments. We present a theoretical investigation of the contrast channels in dAFM in the context of frequency modulation and tapping mode dAFM with an emphasis on low-Q environments.

scholarly journals High-resolution dynamic atomic force microscopy in liquids with different feedback architectures

2013 ◽  
Vol 4 ◽  
pp. 153-163 ◽  
Author(s):  
John Melcher ◽  
David Martínez-Martín ◽  
Miriam Jaafar ◽  
Julio Gómez-Herrero ◽  
Arvind Raman
Keyword(s):  
Atomic Force Microscopy ◽  
High Resolution ◽  
Amplitude Modulation ◽  
Performance Metrics ◽  
Operating Conditions ◽  
Atomic Resolution ◽  
Quality Factors ◽  
Liquid Media ◽  
Force Microscopy ◽  
Atomic Force

The recent achievement of atomic resolution with dynamic atomic force microscopy (dAFM) [Fukuma et al., Appl. Phys. Lett. 2005, 87, 034101], where quality factors of the oscillating probe are inherently low, challenges some accepted beliefs concerning sensitivity and resolution in dAFM imaging modes. Through analysis and experiment we study the performance metrics for high-resolution imaging with dAFM in liquid media with amplitude modulation (AM), frequency modulation (FM) and drive-amplitude modulation (DAM) imaging modes. We find that while the quality factors of dAFM probes may deviate by several orders of magnitude between vacuum and liquid media, their sensitivity to tip–sample forces can be remarkable similar. Furthermore, the reduction in noncontact forces and quality factors in liquids diminishes the role of feedback control in achieving high-resolution images. The theoretical findings are supported by atomic-resolution images of mica in water acquired with AM, FM and DAM under similar operating conditions.

High force sensitivity in Q-controlled phase-modulation atomic force microscopy

2010 ◽  
Vol 97 (1) ◽  
pp. 011906 ◽  
Author(s):  
Naritaka Kobayashi ◽  
Yan Jun Li ◽  
Yoshitaka Naitoh ◽  
Masami Kageshima ◽  
Yasuhiro Sugawara
Keyword(s):  
Atomic Force Microscopy ◽  
Phase Modulation ◽  
Force Microscopy ◽  
Force Sensitivity ◽  
Atomic Force

Optimization of force sensitivity inQ-controlled amplitude-modulation atomic force microscopy

2013 ◽  
Vol 114 (5) ◽  
pp. 054302 ◽  
Author(s):  
Jongwoo Kim ◽  
Baekman Sung ◽  
Byung I. Kim ◽  
Wonho Jhe
Keyword(s):  
Atomic Force Microscopy ◽  
Amplitude Modulation ◽  
Force Microscopy ◽  
Force Sensitivity ◽  
Atomic Force
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