Fabrication of a Si scanning probe microscopy tip with an ultrahigh vacuum-scanning tunneling microscope/atomic force microscope

1997 ◽  
Vol 15 (4) ◽  
pp. 1531
Author(s):  
Takahito Ono
Keyword(s):  
Atomic Force Microscope ◽  
Scanning Probe Microscopy ◽  
Scanning Tunneling Microscope ◽  
Ultrahigh Vacuum ◽  
Scanning Probe ◽  
Scanning Tunneling ◽  
Tunneling Microscope ◽  
Probe Microscopy ◽  
Atomic Force

Development of Low Temperature Ultrahigh Vacuum Atomic Force Microscope/Scanning Tunneling Microscope

2000 ◽  
Vol 39 (Part 1, No. 6B) ◽  
pp. 3750-3752 ◽  
Author(s):  
Katsuyuki Suzuki ◽  
Masashi Iwatsuki ◽  
Shin-ichi Kitamura ◽  
Charles B. Mooney
Keyword(s):  
Low Temperature ◽  
Atomic Force Microscope ◽  
Scanning Tunneling Microscope ◽  
Ultrahigh Vacuum ◽  
Scanning Tunneling ◽  
Tunneling Microscope ◽  
Atomic Force

The atomic-force microscope and its future in biology

1993 ◽  
Vol 51 ◽  
pp. 704-705
Author(s):  
Jean-Paul Revel
Keyword(s):  
Silicon Nitride ◽  
Laser Beam ◽  
Atomic Force Microscope ◽  
Scanning Tunneling Microscope ◽  
Point Of View ◽  
Scanning Tunneling ◽  
Close Relative ◽  
Tunneling Microscope ◽  
Atomic Force ◽  
Sharp Point

The last few years have been marked by a series of remarkable developments in microscopy. Perhaps the most amazing of these is the growth of microscopies which use devices where the place of the lens has been taken by probes, which record information about the sample and display it in a spatial from the point of view of the context. From the point of view of the biologist one of the most promising of these microscopies without lenses is the scanned force microscope, aka atomic force microscope.This instrument was invented by Binnig, Quate and Gerber and is a close relative of the scanning tunneling microscope. Today's AFMs consist of a cantilever which bears a sharp point at its end. Often this is a silicon nitride pyramid, but there are many variations, the object of which is to make the tip sharper. A laser beam is directed at the back of the cantilever and is reflected into a split, or quadrant photodiode.

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