Refined tip preparation by electrochemical etching and ultrahigh vacuum treatment to obtain atomically sharp tips for scanning tunneling microscope and atomic force microscope
2011 ◽
Vol 82
(11)
◽
pp. 113903
◽
2015 ◽
Vol 15
(9)
◽
pp. 1015-1021
◽
2006 ◽
Vol 45
(3B)
◽
pp. 2275-2277
◽
1997 ◽
Vol 15
(4)
◽
pp. 1531
1997 ◽
Vol 15
(4)
◽
pp. 1414
2000 ◽
Vol 39
(Part 1, No. 6B)
◽
pp. 3750-3752
◽
1993 ◽
Vol 51
◽
pp. 704-705