Refined tip preparation by electrochemical etching and ultrahigh vacuum treatment to obtain atomically sharp tips for scanning tunneling microscope and atomic force microscope

2011 ◽  
Vol 82 (11) ◽  
pp. 113903 ◽  
Author(s):  
Till Hagedorn ◽  
Mehdi El Ouali ◽  
William Paul ◽  
David Oliver ◽  
Yoichi Miyahara ◽  
...  
2000 ◽  
Vol 39 (Part 1, No. 6B) ◽  
pp. 3750-3752 ◽  
Author(s):  
Katsuyuki Suzuki ◽  
Masashi Iwatsuki ◽  
Shin-ichi Kitamura ◽  
Charles B. Mooney

Author(s):  
Jean-Paul Revel

The last few years have been marked by a series of remarkable developments in microscopy. Perhaps the most amazing of these is the growth of microscopies which use devices where the place of the lens has been taken by probes, which record information about the sample and display it in a spatial from the point of view of the context. From the point of view of the biologist one of the most promising of these microscopies without lenses is the scanned force microscope, aka atomic force microscope.This instrument was invented by Binnig, Quate and Gerber and is a close relative of the scanning tunneling microscope. Today's AFMs consist of a cantilever which bears a sharp point at its end. Often this is a silicon nitride pyramid, but there are many variations, the object of which is to make the tip sharper. A laser beam is directed at the back of the cantilever and is reflected into a split, or quadrant photodiode.


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