Detection mechanism of an optical evanescent field using a noncontact mode atomic force microscope with a frequency modulation detection method

1997 ◽  
Vol 15 (4) ◽  
pp. 1512 ◽  
Author(s):  
Masayuki Abe
Keyword(s):  
Atomic Force Microscope ◽  
Frequency Modulation ◽  
Detection Method ◽  
Evanescent Field ◽  
Detection Mechanism ◽  
Atomic Force ◽  
Modulation Detection ◽  
Frequency Modulation Detection

Frequency modulation detection atomic force microscopy in the liquid environment

2001 ◽  
Vol 72 (S1) ◽  
pp. S129-S132 ◽  
Author(s):  
S.P. Jarvis ◽  
T. Ishida ◽  
T. Uchihashi ◽  
Y. Nakayama ◽  
H. Tokumoto
Keyword(s):  
Atomic Force Microscopy ◽  
Frequency Modulation ◽  
Liquid Environment ◽  
Force Microscopy ◽  
Atomic Force ◽  
Modulation Detection ◽  
Frequency Modulation Detection

Measurement of the evanescent field using noncontact mode atomic force microscope

1997 ◽  
Vol 4 (1) ◽  
pp. A232-A235
Author(s):  
Masayuki Abe ◽  
Takayuki Uchihashi ◽  
Masahiro Ohta ◽  
Hitoshi Ueyama ◽  
Yasuhiro Sugawara ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Evanescent Field ◽  
Atomic Force

Test Retest Reliability of Jittered Frequency Modulation Detection Test

2019 ◽  
Vol 10 (11) ◽  
pp. 2493
Author(s):  
A. Vidyarani ◽  
Arivudai Nambi Pitchaimuthu ◽  
P.M. Akhilesh ◽  
Jestin Joseph Chacko
Keyword(s):  
Frequency Modulation ◽  
Retest Reliability ◽  
Modulation Detection ◽  
Frequency Modulation Detection ◽  
Test Retest Reliability

Image Calculations with a Numerical Frequency-Modulation Atomic Force Microscope

2013 ◽  
Vol 117 (20) ◽  
pp. 10492-10501 ◽  
Author(s):  
F. Castanié ◽  
L. Nony ◽  
S. Gauthier ◽  
X. Bouju
Keyword(s):  
Atomic Force Microscope ◽  
Frequency Modulation ◽  
Atomic Force
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