Use of maximum entropy deconvolution for the study of silicon delta layers in GaAs

Author(s):  
G. A. Cooke
1993 ◽  
Vol 20 (8) ◽  
pp. 696-702 ◽  
Author(s):  
P. N. Allen ◽  
M. G. Dowsett ◽  
R. Collins

2004 ◽  
Vol 49 (21) ◽  
pp. 4997-5010 ◽  
Author(s):  
A Jannetta ◽  
J C Jackson ◽  
C J Kotre ◽  
I P Birch ◽  
K J Robson ◽  
...  

1987 ◽  
Vol 115 ◽  
pp. 371-371
Author(s):  
Paul M. Harvey ◽  
Daniel F. Lester ◽  
Marshall Joy

New mapping and analysis techniques for NASA's Kuiper Airborne Observatory are described which permit us to obtain information of size scales of order 10″ in the far-infrared. Basically, the focal-plane image is highly oversampled while the telescope is scanned smoothly and repeatedly over the region of interest with a slit of size λ/D. Maximum-entropy deconvolution is then used to obtain spectral frequency information down to scales of ∼ λ/2D.


1989 ◽  
Vol 81 (3) ◽  
pp. 512-519 ◽  
Author(s):  
A.R Mazzeo ◽  
M.A Delsuc ◽  
A Kumar ◽  
G.C Levy

Author(s):  
C. AuYeung ◽  
R. Mersereau ◽  
R. Schafer

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