Application of a reaction-diffusion model for negative chemically amplified resists to determine electron-beam proximity correction parameters
1996 ◽
Vol 14
(6)
◽
pp. 4252
◽
2021 ◽
Vol 7
(3)
◽
Keyword(s):
Keyword(s):
2008 ◽
Vol 96
◽
pp. 012051
◽
Keyword(s):