Application of a reaction-diffusion model for negative chemically amplified resists to determine electron-beam proximity correction parameters

Author(s):  
N. Glezos
2020 ◽  
Vol 19 ◽  
pp. 103462 ◽  
Author(s):  
Hijaz Ahmad ◽  
Tufail A. Khan ◽  
Imtiaz Ahmad ◽  
Predrag S. Stanimirović ◽  
Yu-Ming Chu

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