Nanometer-scale modification of tribomechanical properties of Si(111):H surfaces performed and investigated by a conducting-probe scanning force microscope

1996 ◽  
Vol 14 (2) ◽  
pp. 1268 ◽  
Author(s):  
T. Teuschler
Keyword(s):  
Nanometer Scale ◽  
Scanning Force Microscope ◽  
Scanning Force ◽  
Tribomechanical Properties

Nanometer‐scale modification of the tribological properties of Si(100) by scanning force microscope

1995 ◽  
Vol 66 (19) ◽  
pp. 2499-2501 ◽  
Author(s):  
T. Teuschler ◽  
K. Mahr ◽  
S. Miyazaki ◽  
M. Hundhausen ◽  
L. Ley
Keyword(s):  
Tribological Properties ◽  
Nanometer Scale ◽  
Scanning Force Microscope ◽  
Scanning Force

Nanometer-Scale Modification and Imaging of Polyimide Films by Scanning Force Microscopy

1991 ◽  
Vol 239 ◽  
Author(s):  
W. N. Unertl ◽  
X. Jin
Keyword(s):  
Scanning Force Microscopy ◽  
Polymer Surfaces ◽  
Degree Of Crystallinity ◽  
Nanometer Scale ◽  
Polyimide Films ◽  
Scanning Force Microscope ◽  
Force Microscopy ◽  
Scanning Force ◽  
Micrometer Size ◽  
The Degree Of Crystallinity

ABSTRACTThe sharp tip of a scanning force microscope can be used to make controlled modifications of polymer surfaces. In this paper, we describe the properties of micrometer size pits up to 900 Å deep formed on Kapton-H surfaces. The structure at the bottom of the pits appears to be closely related to the degree of crystallinity near the surface. We also use elasticity theory to estimate that the resolution of scanning force microscopy for polymer surfaces is about 160 Å for tips with 400 Å radius. This estimate agrees well with the resolution obtained in images of polyimide surfaces.

Controlling Nanometer-Scale Crystal Growth on a Model Biomaterial with a Scanning Force Microscope

Langmuir ◽  
2002 ◽  
Vol 18 (21) ◽  
pp. 7773-7776 ◽  
Author(s):  
R. Hariadi ◽  
S. C. Langford ◽  
J. T. Dickinson
Keyword(s):  
Crystal Growth ◽  
Nanometer Scale ◽  
Scanning Force Microscope ◽  
Scanning Force

Compact scanning-force microscope using a laser diode

1988 ◽  
Vol 13 (12) ◽  
pp. 1057 ◽  
Author(s):  
Dror Sarid ◽  
L. Stephen Bell ◽  
Doug Iams ◽  
Volker Weissenberger
Keyword(s):  
Laser Diode ◽  
Scanning Force Microscope ◽  
Scanning Force
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