Characterization of a GaAs metal–semiconductor–metal low-energy electron detector

1995 ◽  
Vol 13 (6) ◽  
pp. 2556 ◽  
Author(s):  
S. Zolgharnain
Keyword(s):  
Low Energy ◽  
Energy Electron ◽  
Electron Detector ◽  
Metal Semiconductor Metal ◽  
Low Energy Electron

scholarly journals Characterization of hexagonal boron nitride layers on nickel surfaces by low-energy electron microscopy

2017 ◽  
Vol 659 ◽  
pp. 31-42 ◽  
Author(s):  
P.C. Mende ◽  
Q. Gao ◽  
A. Ismach ◽  
H. Chou ◽  
M. Widom ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Boron Nitride ◽  
Hexagonal Boron Nitride ◽  
Low Energy ◽  
Energy Electron ◽  
Low Energy Electron ◽  
Nitride Layers

Characterization of Surface Defect Structure by Low Energy Electron Diffraction

1984 ◽  
Vol 41 ◽  
Author(s):  
J. F. Wendelken ◽  
G. -C. Wang ◽  
J. M. Pimbley ◽  
T. -M. Lu
Keyword(s):  
Electron Beam ◽  
Electron Diffraction ◽  
Surface Defect ◽  
Low Energy ◽  
Experimental Results ◽  
Energy Electron ◽  
Low Energy Electron Diffraction ◽  
Low Energy Electron

AbstractLow energy electron diffraction is a surface sensitive tool which is most widely used for the determination of surface symmetries and equilibrium atomic positions. Experimental and theoretical advances made in the past five years make it possible now to use LEED also for the characterization of a wide variety of surface defect structures. In this paper a variety of experimental results involving analysis of diffracted electron beam shapes as a function of primary electron beam energy, adsorbate coverage, crystal tem-perature and ordering time are presented. These experimental results coupled with kinematic theory, allow the determination of step density, size and shape of reconstruction domains and overlayer islands, island size distribution in an overlayer during growth, and the mode of growth.

High resolution, low energy electron detector

2011 ◽  
Vol 6 (01) ◽  
pp. P01001-P01001 ◽  
Author(s):  
O X Esebamen ◽  
D Krapohl ◽  
G Thungström ◽  
H -E Nilsson
Keyword(s):  
High Resolution ◽  
Low Energy ◽  
Energy Electron ◽  
Electron Detector ◽  
Low Energy Electron

Characterization of Thin MgO Films on Ag(001) by Low-Energy Electron Diffraction and Scanning Tunneling Microscopy

2011 ◽  
Vol 115 (16) ◽  
pp. 8034-8041 ◽  
Author(s):  
Aimeric Ouvrard ◽  
Johannes Niebauer ◽  
Ahmed Ghalgaoui ◽  
Clemens Barth ◽  
Claude R. Henry ◽  
...  
Keyword(s):  
Electron Diffraction ◽  
Scanning Tunneling Microscopy ◽  
Low Energy ◽  
Energy Electron ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Low Energy Electron Diffraction ◽  
Low Energy Electron
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