Ellipsometry study of the nucleation of Si epitaxy by electron cyclotron resonance plasma chemical vapor deposition
1995 ◽
Vol 13
(1)
◽
pp. 105
◽
Radical Fluxes in Electron Cyclotron Resonance Plasma Chemical Vapor Deposition of Amorphous Silicon
1995 ◽
Vol 34
(Part 1, No. 11)
◽
pp. 5965-5970
◽
1998 ◽
Vol 37
(Part 1, No. 12B)
◽
pp. 6959-5964
1991 ◽
Vol 30
(Part 1, No. 12B)
◽
pp. 3558-3561
◽
1991 ◽
Vol 137-138
◽
pp. 669-672
◽
2000 ◽
Vol 211
(1-4)
◽
pp. 216-219
◽
Low‐Temperature Si Epitaxial Growth by Electron Cyclotron Resonance Plasma Chemical Vapor Deposition
1992 ◽
Vol 139
(7)
◽
pp. 1983-1988
◽