Measurement of AlxGa1−xAs temperature dependent optical constants by spectroscopic ellipsometry

1995 ◽  
Vol 13 (2) ◽  
pp. 681 ◽  
Author(s):  
C. H. Kuo
Keyword(s):  
Spectroscopic Ellipsometry ◽  
Optical Constants ◽  
Temperature Dependent

scholarly journals Vanadium-Oxide-Based Thin Films with Ultra-High Thermo-Optic Coefficients at 1550 nm and 2000 nm Wavelengths

Materials ◽  
2020 ◽  
Vol 13 (8) ◽  
pp. 2002
Author(s):  
Mohamed Abdel-Rahman ◽  
Esam Bahidra ◽  
Ahmed Fauzi Abas
Keyword(s):  
Thin Films ◽  
Dielectric Properties ◽  
Vanadium Oxide ◽  
Optical Communication ◽  
Spectroscopic Ellipsometry ◽  
Optical Constants ◽  
Tunable Filters ◽  
Temperature Dependent ◽  
Vanadium Sesquioxide ◽  
Vanadium Oxide Thin Films

In this paper, the temperature-dependent dielectric properties of vanadium-sesquioxide-based thin films are studied to assess their suitability for thermally tunable filters at optical communication wavelengths. Spectroscopic ellipsometry is utilized to measure the optical constants of vanadium oxide thin films at temperatures ranging from 25 °C to 65 °C. High thermo-optic coefficients (dn/dTs) were observed. The highest dn/dTs, measured at approximately 40 °C, were −8.4 × 10−3/°C and −1.05 × 10−2/°C at 1550 nm and 2000 nm, respectively.

Optical constants of DC magnetron sputtered titanium dioxide thin films measured by spectroscopic ellipsometry

2003 ◽  
Vol 38 (9) ◽  
pp. 773-778 ◽  
Author(s):  
B. Karunagaran ◽  
R. T. Rajendra Kumar ◽  
C. Viswanathan ◽  
D. Mangalaraj ◽  
Sa. K. Narayandass ◽  
...  
Keyword(s):  
Thin Films ◽  
Titanium Dioxide ◽  
Spectroscopic Ellipsometry ◽  
Optical Constants ◽  
Titanium Dioxide Thin Films

scholarly journals Determination of the Thickness and Optical Constants of ZrO2 by Spectroscopic Ellipsometry and Spectrophotometric Method

2011 ◽  
Vol 8 ◽  
pp. 223-227 ◽  
Author(s):  
R. Yusoh ◽  
M. Horprathum ◽  
P. Eiamchai ◽  
S. Chanyawadee ◽  
K. Aiempanakit
Keyword(s):  
Spectroscopic Ellipsometry ◽  
Spectrophotometric Method ◽  
Optical Constants

Detection of an ordered-structure fraction in amorphous silicon

2016 ◽  
Vol 49 (2) ◽  
pp. 528-532 ◽  
Author(s):  
Xiao-Dong Wang ◽  
Bo Chen ◽  
Hai-Feng Wang ◽  
Xin Zheng ◽  
Shi-Jie Liu ◽  
...  
Keyword(s):  
Magnetron Sputtering ◽  
Radio Frequency ◽  
Amorphous Silicon ◽  
Spectroscopic Ellipsometry ◽  
Optical Constants ◽  
Ordered Structure ◽  
Radio Frequency Magnetron Sputtering ◽  
Medium Range Order ◽  
Medium Range ◽  
Si Films

Amorphous silicon (a-Si) films were prepared by radio frequency magnetron sputtering. Spectroscopic ellipsometry (SE) was utilized to detect an ordered-structure fraction in a-Si. The SE analysis of a-Si films with different thicknesses (7.0–140.0 nm) demonstrates that no more than 2.81% of medium-range order exists in the samples, and interestingly, there is a thickness dependence of optical constants for a-Si in the range of 1.5–5.0 eV.

Eagle XG® glass: Optical constants from 196 to 1688 nm (0.735–6.33 eV) by spectroscopic ellipsometry

2017 ◽  
Vol 24 (2) ◽  
pp. 026001 ◽  
Author(s):  
Cody V. Cushman ◽  
Brian I. Johnson ◽  
Andrew Martin ◽  
Barry M. Lunt ◽  
Nicholas J. Smith ◽  
...  
Keyword(s):  
Spectroscopic Ellipsometry ◽  
Optical Constants
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