scholarly journals Doping and temperature-dependent UV-Vis optical constants of cubic SrTiO3: a combined spectroscopic ellipsometry and first-principles study

2021 ◽  
Vol 11 (3) ◽  
pp. 895
Author(s):  
Wenjie Zhang ◽  
Tianhao Fei ◽  
Tao Cheng ◽  
Chong Zheng ◽  
Yanbing Dong ◽  
...  
Keyword(s):  
Spectroscopic Ellipsometry ◽  
First Principles ◽  
Optical Constants ◽  
Temperature Dependent ◽  
First Principles Study

Temperature-dependent properties of monolayer MoS2 annealed in an Ar diluted S atmosphere: an experimental and first-principles study

2017 ◽  
Vol 5 (42) ◽  
pp. 11138-11143 ◽  
Author(s):  
Lei Wang ◽  
Xiaohong Ji ◽  
Fei Chen ◽  
Qinyuan Zhang
Keyword(s):  
Optical Properties ◽  
First Principles ◽  
Monolayer Mos2 ◽  
Temperature Dependent ◽  
Structural And Optical Properties ◽  
First Principles Study ◽  
Temperature Dependent Properties

Monolayer MoS2 annealed under an Ar diluted S atmosphere exhibited novel structural and optical properties.

Temperature-dependent stacking fault energies of 4H-SiC: A first-principles study

2020 ◽  
Vol 127 (12) ◽  
pp. 125703 ◽  
Author(s):  
Hiroki Sakakima ◽  
So Takamoto ◽  
Asuka Hatano ◽  
Satoshi Izumi
Keyword(s):  
First Principles ◽  
Stacking Fault ◽  
Temperature Dependent ◽  
First Principles Study ◽  
Stacking Fault Energies

scholarly journals Vanadium-Oxide-Based Thin Films with Ultra-High Thermo-Optic Coefficients at 1550 nm and 2000 nm Wavelengths

Materials ◽  
2020 ◽  
Vol 13 (8) ◽  
pp. 2002
Author(s):  
Mohamed Abdel-Rahman ◽  
Esam Bahidra ◽  
Ahmed Fauzi Abas
Keyword(s):  
Thin Films ◽  
Dielectric Properties ◽  
Vanadium Oxide ◽  
Optical Communication ◽  
Spectroscopic Ellipsometry ◽  
Optical Constants ◽  
Tunable Filters ◽  
Temperature Dependent ◽  
Vanadium Sesquioxide ◽  
Vanadium Oxide Thin Films

In this paper, the temperature-dependent dielectric properties of vanadium-sesquioxide-based thin films are studied to assess their suitability for thermally tunable filters at optical communication wavelengths. Spectroscopic ellipsometry is utilized to measure the optical constants of vanadium oxide thin films at temperatures ranging from 25 °C to 65 °C. High thermo-optic coefficients (dn/dTs) were observed. The highest dn/dTs, measured at approximately 40 °C, were −8.4 × 10−3/°C and −1.05 × 10−2/°C at 1550 nm and 2000 nm, respectively.

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