Interface characterization in an InP/InGaAs resonant tunneling diode by scanning tunneling microscopy

Author(s):  
S. L. Skala
1996 ◽  
Vol 35 (Part 1, No. 6B) ◽  
pp. 3695-3699 ◽  
Author(s):  
Franz J. Himpsel ◽  
Thomas Jung ◽  
Reto Schlittler ◽  
Jim K. Gimzewski

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