Synchrotron radiation x-ray photoelectron spectroscopy study of hydrogen-terminated Si surfaces and their oxidation mechanism

Ken-ichi Yamamoto

doi:10.1116/1.587790

Synchrotron radiation x-ray photoelectron spectroscopy study of hydrogen-terminated Si surfaces and their oxidation mechanism

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.587790 ◽

1994 ◽

Vol 12 (4) ◽

pp. 2493 ◽

Cited By ~ 22

Author(s):

Ken-ichi Yamamoto

Keyword(s):

Synchrotron Radiation ◽

Photoelectron Spectroscopy ◽

Oxidation Mechanism ◽

Spectroscopy Study ◽

X Ray

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GaSb/GaAs quantum dot systems: in situ synchrotron radiation x-ray photoelectron spectroscopy study

Nanotechnology ◽

10.1088/0957-4484/16/8/058 ◽

2005 ◽

Vol 16 (8) ◽

pp. 1326-1334 ◽

Cited By ~ 8

Author(s):

V N Strocov ◽

G E Cirlin ◽

J Sadowski ◽

J Kanski ◽

R Claessen

Keyword(s):

Synchrotron Radiation ◽

Quantum Dot ◽

Photoelectron Spectroscopy ◽

Spectroscopy Study ◽

X Ray ◽

Gaas Quantum Dot

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X-Ray Photoelectron Spectroscopy Study of Synchrotron Radiation Irradiation of a Polytetrafluoroethylene Surface

Japanese Journal of Applied Physics ◽

10.1143/jjap.42.1722 ◽

2003 ◽

Vol 42 (Part 1, No. 4A) ◽

pp. 1722-1724 ◽

Cited By ~ 15

Author(s):

Yuichi Haruyama ◽

Tomoya Ideta ◽

Hiroyuki Ishigaki ◽

Kazuhiro Kanda ◽

Shinji Matsui

Keyword(s):

Synchrotron Radiation ◽

Photoelectron Spectroscopy ◽

Spectroscopy Study ◽

X Ray

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Scandium function in “scandate” thermionic cathodes: A microspot synchrotron radiation x-ray photoelectron spectroscopy study of co-adsorbed Ba-Sc-O on W(100)

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.5094258 ◽

2019 ◽

Vol 37 (3) ◽

pp. 030602 ◽

Cited By ~ 3

Author(s):

Michael V. Mroz ◽

Martin E. Kordesch ◽

Jerzy T. Sadowski

Keyword(s):

Synchrotron Radiation ◽

Photoelectron Spectroscopy ◽

Spectroscopy Study ◽

X Ray ◽

Thermionic Cathodes

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Synchrotron radiation x-ray photoelectron spectroscopy study on the interface chemistry of high-k PrxAl2−xO3 (x=0–2) dielectrics on TiN for dynamic random access memory applications

Journal of Applied Physics ◽

10.1063/1.2749468 ◽

2007 ◽

Vol 102 (1) ◽

pp. 014103 ◽

Cited By ~ 29

Author(s):

T. Schroeder ◽

G. Lupina ◽

R. Sohal ◽

G. Lippert ◽

Ch. Wenger ◽

...

Keyword(s):

Synchrotron Radiation ◽

Photoelectron Spectroscopy ◽

Random Access ◽

Random Access Memory ◽

Spectroscopy Study ◽

Access Memory ◽

Interface Chemistry ◽

X Ray ◽

High K ◽

Memory Applications

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Annealing Effect on the Chemical Composition of a Synchrotron Radiation Irradiated Polytetrafluoroethylene (PTFE) Surface by the X-ray Photoelectron Spectroscopy

IEEJ Transactions on Electronics Information and Systems ◽

10.1541/ieejeiss.130.1741 ◽

2010 ◽

Vol 130 (10) ◽

pp. 1741-1745

Author(s):

Yuichi Haruyama ◽

Shinji Matsui ◽

Tomoya Ideta ◽

Hiroyuki Ishigaki

Keyword(s):

Chemical Composition ◽

Synchrotron Radiation ◽

Photoelectron Spectroscopy ◽

Annealing Effect ◽

X Ray ◽

Ptfe Surface

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X-Ray Photoelectron Spectroscopy Study of Si-C Film Growth by Chemical Vapor Deposition of Ethylene on Si(100)

10.21236/ada197437 ◽

1988 ◽

Author(s):

P. A. Taylor ◽

M. Bozack ◽

W. J. Choyke ◽

J. T. Yates ◽

Keyword(s):

Chemical Vapor Deposition ◽

Vapor Deposition ◽

Photoelectron Spectroscopy ◽

Film Growth ◽

Chemical Vapor ◽

Spectroscopy Study ◽

X Ray

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Time‐of‐flight secondary ion mass spectrometry and X‐ray photoelectron spectroscopy study of 2‐phenylimidazole on brass

Rapid Communications in Mass Spectrometry ◽

10.1002/rcm.8974 ◽

2020 ◽

Vol 35 (2) ◽

Author(s):

Matjaž Finšgar

Keyword(s):

Mass Spectrometry ◽

Photoelectron Spectroscopy ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Spectroscopy Study ◽

X Ray ◽

Ion Mass Spectrometry ◽

Secondary Ion

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A high-resolution X-ray photoelectron spectroscopy study of trifluoroacetic anhydride labelling of hydroxyl groups: demonstration of the β shift due to OC(O)CF3

Polymer ◽

10.1016/0032-3861(93)90418-a ◽

1993 ◽

Vol 34 (9) ◽

pp. 1795-1799 ◽

Cited By ~ 35

Author(s):

A.P. Ameen ◽

R.J. Ward ◽

R.D. Short ◽

G. Beamson ◽

D. Briggs

Keyword(s):

High Resolution ◽

Photoelectron Spectroscopy ◽

Trifluoroacetic Anhydride ◽

Hydroxyl Groups ◽

Spectroscopy Study ◽

X Ray

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An X-ray photoelectron spectroscopy study of the surface layers between diamond crystallites and silicon substrate deposited by microwave-plasma-assisted chemical vapour deposition

Diamond and Related Materials ◽

10.1016/0925-9635(93)90120-q ◽

1993 ◽

Vol 2 (2-4) ◽

pp. 558-561 ◽

Cited By ~ 5

Author(s):

S. Haq ◽

C. Somerton ◽

D. Tunnicliffe ◽

J.A. Savage ◽

P. John ◽

...

Keyword(s):

Chemical Vapour Deposition ◽

Silicon Substrate ◽

Photoelectron Spectroscopy ◽

Vapour Deposition ◽

Microwave Plasma ◽

Chemical Vapour ◽

Spectroscopy Study ◽

Surface Layers ◽

X Ray

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Combined Time-of-Flight Secondary Ion Mass Spectrometry and X-ray Photoelectron Spectroscopy Study of the Surface Segregation of Poly(methyl methacrylate) (PMMA) in Bisphenol A Polycarbonate/PMMA Blends

Macromolecules ◽

10.1021/ma00117a038 ◽

1995 ◽

Vol 28 (13) ◽

pp. 4631-4637 ◽

Cited By ~ 52

Author(s):

J.-B. Lhoest ◽

P. Bertrand ◽

L. T. Weng ◽

J.-L. Dewez

Keyword(s):

Mass Spectrometry ◽

Bisphenol A ◽

Photoelectron Spectroscopy ◽

Surface Segregation ◽

Secondary Ion Mass Spectrometry ◽

Spectroscopy Study ◽

Bisphenol A Polycarbonate ◽

X Ray ◽

Secondary Ion ◽

Pmma Blends

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