Comparison of advanced plasma sources for etching applications. I. Etching rate, uniformity, and profile control in a helicon and a multiple electron cyclotron resonance source
1994 ◽
Vol 12
(4)
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pp. 2310
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Keyword(s):
1992 ◽
Vol 10
(4)
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pp. 1295-1302
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1992 ◽
Vol 10
(5)
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pp. 3104-3113
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1994 ◽
Vol 12
(3)
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pp. 1340
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Keyword(s):
2012 ◽
Vol 51
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pp. 08HD01
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1989 ◽
Vol 7
(3)
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pp. 894-898
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