Scanning tunneling microscopy study of solid-phase epitaxy processes of argon ion bombarded silicon surface and recovery of crystallinity by annealing

Author(s):  
K. Uesugi
1993 ◽  
Vol 48 (20) ◽  
pp. 15492-15495 ◽  
Author(s):  
X.-D. Wang ◽  
Q. K. Xue ◽  
T. Hashizume ◽  
H. Shinohara ◽  
Y. Nishina ◽  
...  

Langmuir ◽  
2009 ◽  
Vol 25 (23) ◽  
pp. 13606-13613 ◽  
Author(s):  
Florian Mögele ◽  
Donato Fantauzzi ◽  
Ulf Wiedwald ◽  
Paul Ziemann ◽  
Bernhard Rieger

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