Scanning tunneling microscopy study of solid-phase epitaxy processes of argon ion bombarded silicon surface and recovery of crystallinity by annealing
1994 ◽
Vol 12
(3)
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pp. 2018
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1994 ◽
Vol 82-83
◽
pp. 367-373
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1999 ◽
pp. 323-336
1993 ◽
Vol 48
(20)
◽
pp. 15492-15495
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