High-speed single-layer-resist process and energy-dependent aspect ratios for 0.2-μm electron-beam lithography

Author(s):  
Fumio Murai
2015 ◽  
Vol 143 ◽  
pp. 37-40 ◽  
Author(s):  
Jinhai Shao ◽  
Sichao Zhang ◽  
Jianpeng Liu ◽  
Bing-Rui Lu ◽  
Nit Taksatorn ◽  
...  

1986 ◽  
Vol 7 (7) ◽  
pp. 425-427 ◽  
Author(s):  
Y. Tamaki ◽  
F. Murai ◽  
Y. Kawamoto ◽  
K. Uehara ◽  
A. Hayasaka ◽  
...  

1991 ◽  
Vol 69 (3-4) ◽  
pp. 508-511
Author(s):  
M. Fallahi ◽  
R. Barber

A simple, manufacturable technique for the generation of sub-half-micrometre gratings in GaAs is demonstrated. The technique uses a single layer of polymethylmethacrylate photoresist, electron-beam lithography, and BCl3–He reactive ion etching to achieve high-quality second-order gratings. Good light attenuation properties are demonstrated for planar and ridge wave guides.


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