Sublattice orientation dilemma: A reflection high-energy electron diffraction and x-ray photoelectron diffraction study of GaAs growth on vicinal Si(001) surfaces
1992 ◽
Vol 10
(4)
◽
pp. 1835
◽
Keyword(s):
X Ray
◽
1991 ◽
Vol 9
(6)
◽
pp. 3025-3030
◽
1996 ◽
Vol 159
(1-4)
◽
pp. 694-702
◽
1990 ◽
Vol 8
(3)
◽
pp. 431
◽
1984 ◽
Vol 52
(8)
◽
pp. 637-639
◽
1993 ◽
Vol 134
(1-2)
◽
pp. 75-80
◽
1989 ◽
Vol 7
(6)
◽
pp. 1357
◽
1986 ◽
Vol 54
(3)
◽
pp. L89-L94
◽
Keyword(s):