scholarly journals Scanning tunneling microscopy at high gap resistances and on chemically modified silicon surfaces

1991 ◽  
Vol 9 (2) ◽  
pp. 1171 ◽  
Author(s):  
Troy E. Wilson
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Silicon Surfaces ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Chemically Modified

Scanning Tunneling Microscopy and Spectroscopy of Semiconductor Surfaces

1986 ◽  
Vol 77 ◽  
Author(s):  
J. E. Demuth ◽  
R. J. Hamers ◽  
R. M. Tromp
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Local Structure ◽  
Localized States ◽  
Silicon Surfaces ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Geometric Information ◽  
Charge Densities ◽  
Surface Electronic Structure ◽  
New Information

ABSTRACTThe principles of scanning tunneling microscopy and its application to study silicon surfaces are briefly reviewed. Scanning tunneling microscopy “topographs” contain both geometric information about the locations of atoms at the surface as well as about the charge densities of surface localized states. We describe procedures by which these two components can be distinguished so as to produce images of the surface electronic states with atomic resolution. This ability to spatially resolve the surface electronic structure provides new information to understand the local structure and nature of bonding, and in some cases can be used as a means to chemically image specific features of the surface.

Scanning tunneling microscopy of fluorinated fullerene molecules on silicon surfaces

2014 ◽  
Vol 78 (1) ◽  
pp. 34-38 ◽  
Author(s):  
R. Z. Bakhtizin ◽  
A. I. Oreshkin ◽  
V. N. Mantsevich ◽  
S. I. Oreshkn ◽  
S. V. Savinov
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Silicon Surfaces ◽  
Scanning Tunneling ◽  
Tunneling Microscopy

Scanning tunneling microscopy of silicon surfaces in air: Observation of atomic images

1990 ◽  
Vol 8 (1) ◽  
pp. 262-265 ◽  
Author(s):  
Y. Nakagawa ◽  
A. Ishitani ◽  
T. Takahagi ◽  
H. Kuroda ◽  
H. Tokumoto ◽  
...  
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Silicon Surfaces ◽  
Scanning Tunneling ◽  
Tunneling Microscopy

Scanning Tunneling Microscopy Using Chemically Modified Tips

1998 ◽  
Vol 70 (2) ◽  
pp. 255-259 ◽  
Author(s):  
Takashi Ito ◽  
Philippe Bühlmann ◽  
Yoshio Umezawa
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Chemically Modified
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