InSb–CdTe interfaces: A combined study by soft x-ray photoemission, low-energy electron diffraction, and Raman spectroscopy

K. J. Mackey

doi:10.1116/1.583719

InSb–CdTe interfaces: A combined study by soft x-ray photoemission, low-energy electron diffraction, and Raman spectroscopy

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.583719 ◽

1987 ◽

Vol 5 (4) ◽

pp. 1233 ◽

Cited By ~ 28

Author(s):

K. J. Mackey

Keyword(s):

Raman Spectroscopy ◽

Electron Diffraction ◽

Low Energy ◽

Energy Electron ◽

X Ray ◽

Low Energy Electron Diffraction ◽

Low Energy Electron

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Structures of sulfur on TiO2() determined by scanning tunneling microscopy, X-ray photoelectron spectroscopy and low-energy electron diffraction

Surface Science ◽

10.1016/s0039-6028(00)00849-9 ◽

2001 ◽

Vol 470 (3) ◽

pp. 347-360 ◽

Cited By ~ 56

Author(s):

E.L.D. Hebenstreit ◽

W. Hebenstreit ◽

U. Diebold

Keyword(s):

Electron Diffraction ◽

Scanning Tunneling Microscopy ◽

Photoelectron Spectroscopy ◽

Low Energy ◽

Energy Electron ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

X Ray ◽

Low Energy Electron Diffraction ◽

Low Energy Electron

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Low-Energy-Electron-Diffraction and X-ray-Phototelectron-Spectroscopy Studies of Graphitization of 3C-SiC(111) Thin Film on Si(111) Substrate

Japanese Journal of Applied Physics ◽

10.1143/jjap.50.070103 ◽

2011 ◽

Vol 50 (7) ◽

pp. 070103 ◽

Cited By ~ 9

Author(s):

Ryota Takahashi ◽

Hiroyuki Handa ◽

Shunsuke Abe ◽

Kei Imaizumi ◽

Hirokazu Fukidome ◽

...

Keyword(s):

Thin Film ◽

Electron Diffraction ◽

Low Energy ◽

Energy Electron ◽

X Ray ◽

Low Energy Electron Diffraction ◽

Low Energy Electron ◽

Spectroscopy Studies

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Non-destructive assessment of the polarity of GaN nanowire ensembles using low-energy electron diffraction and x-ray photoelectron diffraction

Applied Physics Letters ◽

10.1063/1.4905651 ◽

2015 ◽

Vol 106 (2) ◽

pp. 021602 ◽

Cited By ~ 18

Author(s):

O. Romanyuk ◽

S. Fernández-Garrido ◽

P. Jiříček ◽

I. Bartoš ◽

L. Geelhaar ◽

...

Keyword(s):

Electron Diffraction ◽

Low Energy ◽

Energy Electron ◽

X Ray ◽

Photoelectron Diffraction ◽

Low Energy Electron Diffraction ◽

Low Energy Electron ◽

Gan Nanowire ◽

Non Destructive

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X-ray photoelectron diffraction and low-energy electron diffraction study of the interaction of oxygen with the Ni(001) surface: c(2 × 2) to saturated oxide

Surface Science ◽

10.1016/0039-6028(93)90608-m ◽

1993 ◽

Vol 282 (1-2) ◽

pp. 33-61 ◽

Cited By ~ 72

Author(s):

R.S. Saiki ◽

A.P. Kaduwela ◽

M. Sagurton ◽

J. Osterwalder ◽

D.J. Friedman ◽

...

Keyword(s):

Electron Diffraction ◽

Diffraction Study ◽

Electron Diffraction Study ◽

Low Energy ◽

Energy Electron ◽

X Ray ◽

Photoelectron Diffraction ◽

Low Energy Electron Diffraction ◽

Low Energy Electron

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Reactivity towards oxygen of surfaces investigated by ultraviolet photoelectron spectroscopy, X-ray photoelectron spectroscopy and low energy electron diffraction spectroscopy

Journal of Electron Spectroscopy and Related Phenomena ◽

10.1016/0368-2048(95)02361-5 ◽

1995 ◽

Vol 74 (2) ◽

pp. 129-134 ◽

Cited By ~ 5

Author(s):

S. Di Nardo ◽

L. Lozzi ◽

M. Passacantando ◽

P. Picozzi ◽

S. Santucci

Keyword(s):

Electron Diffraction ◽

Photoelectron Spectroscopy ◽

Low Energy ◽

Energy Electron ◽

Ultraviolet Photoelectron Spectroscopy ◽

X Ray ◽

Low Energy Electron Diffraction ◽

Low Energy Electron

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Low work function and surface structure of the LaB6(210) surface studied by angle‐resolved x‐ray spectroscopy, ultraviolet spectroscopy, and low‐energy electron diffraction

Journal of Applied Physics ◽

10.1063/1.327681 ◽

1980 ◽

Vol 51 (2) ◽

pp. 997-1000 ◽

Cited By ~ 14

Author(s):

C. Oshima ◽

M. Aono ◽

T. Tanaka ◽

R. Nishitani ◽

S. Kawai

Keyword(s):

Electron Diffraction ◽

Work Function ◽

Surface Structure ◽

Low Energy ◽

Energy Electron ◽

Ultraviolet Spectroscopy ◽

X Ray ◽

Low Energy Electron Diffraction ◽

Low Energy Electron

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Structure of the TiO2(100) 1 × 3 surface determined by glancing angle X-ray diffraction and low energy electron diffraction

Surface Science ◽

10.1016/0039-6028(92)90136-t ◽

1992 ◽

Vol 262 (3) ◽

pp. 395-408 ◽

Cited By ~ 66

Author(s):

P. Zschack ◽

J.B. Cohen ◽

Y.W. Chung

Keyword(s):

Electron Diffraction ◽

Low Energy ◽

Energy Electron ◽

X Ray Diffraction ◽

X Ray ◽

Low Energy Electron Diffraction ◽

Glancing Angle ◽

Low Energy Electron

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Studies on the ZrO/W(100) surface by means of low-energy electron diffraction and X-ray photoelectron spectroscopy

Surface Science ◽

10.1016/s0039-6028(97)00896-0 ◽

1998 ◽

Vol 400 (1-3) ◽

pp. 375-382 ◽

Cited By ~ 16

Author(s):

Hideki Satoh ◽

Satoru Kawata ◽

Hideaki Nakane ◽

Hiroshi Adachi

Keyword(s):

Electron Diffraction ◽

Photoelectron Spectroscopy ◽

Low Energy ◽

Energy Electron ◽

X Ray ◽

Low Energy Electron Diffraction ◽

Low Energy Electron

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Low-Energy-Electron-Diffraction and X-ray-Phototelectron-Spectroscopy Studies of Graphitization of 3C-SiC(111) Thin Film on Si(111) Substrate

Japanese Journal of Applied Physics ◽

10.7567/jjap.50.070103 ◽

2011 ◽

Vol 50 (7R) ◽

pp. 070103 ◽

Cited By ~ 16

Author(s):

Ryota Takahashi ◽

Hiroyuki Handa ◽

Shunsuke Abe ◽

Kei Imaizumi ◽

Hirokazu Fukidome ◽

...

Keyword(s):

Thin Film ◽

Electron Diffraction ◽

Low Energy ◽

Energy Electron ◽

X Ray ◽

Low Energy Electron Diffraction ◽

Low Energy Electron ◽

Spectroscopy Studies

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Low energy electron diffraction and X-ray photoelectron diffraction study of the Cs/Si(001) surface: dependence on Cs coverage

Surface Science Letters ◽

10.1016/0167-2584(91)91192-y ◽

1991 ◽

Vol 256 (3) ◽

pp. A543

Author(s):

T. Abukawa ◽

T. Okane ◽

S. Kono

Keyword(s):

Electron Diffraction ◽

Diffraction Study ◽

Low Energy ◽

Energy Electron ◽

X Ray ◽

Photoelectron Diffraction ◽

Low Energy Electron Diffraction ◽

Low Energy Electron

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