Origin, symmetry, and temperature dependence of the perturbation induced by Si extrinsic defects on the Sn/Si(111) α surface: A scanning tunneling microscopy study

2000 ◽  
Vol 18 (4) ◽  
pp. 1946-1949 ◽  
Author(s):  
L. Ottaviano ◽  
M. Crivellari ◽  
G. Profeta ◽  
A. Continenza ◽  
L. Lozzi ◽  
...  
Langmuir ◽  
2009 ◽  
Vol 25 (23) ◽  
pp. 13606-13613 ◽  
Author(s):  
Florian Mögele ◽  
Donato Fantauzzi ◽  
Ulf Wiedwald ◽  
Paul Ziemann ◽  
Bernhard Rieger

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