Origin, symmetry, and temperature dependence of the perturbation induced by Si extrinsic defects on the Sn/Si(111) α surface: A scanning tunneling microscopy study
2000 ◽
Vol 18
(4)
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pp. 1946-1949
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1993 ◽
Vol 22
(1-4)
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pp. 85-87
2013 ◽
Vol 138
(19)
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pp. 194707
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