Defect analysis of Cl2/HBr/He/O2 etching process by imaging time-of-flight secondary ion mass spectrometry

2000 ◽  
Vol 18 (1) ◽  
pp. 207-212 ◽  
Author(s):  
Jin Zhao ◽  
D. Fraser Reich ◽  
Thien T. Nguyen ◽  
Larry Zhao ◽  
Tim Z. Hossain
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
Etching Process ◽  
Defect Analysis ◽  
Imaging Time ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Exchange of Fluorinated Cyanine Dyes between Different Types of Silver Halide Microcrystals Studied by Imaging Time-of-Flight Secondary Ion Mass Spectrometry

Langmuir ◽  
2001 ◽  
Vol 17 (23) ◽  
pp. 7332-7338 ◽  
Author(s):  
Jens Lenaerts ◽  
Geert Verlinden ◽  
Luc Van Vaeck ◽  
Renaat Gijbels ◽  
Ingrid Geuens ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Silver Halide ◽  
Time Of Flight ◽  
Cyanine Dyes ◽  
Imaging Time ◽  
Different Types ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Imaging of Membrane Lipids in Single Cells by Imprint-Imaging Time-of-Flight Secondary Ion Mass Spectrometry

2003 ◽  
Vol 75 (14) ◽  
pp. 3429-3434 ◽  
Author(s):  
Peter Sjövall ◽  
Jukka Lausmaa ◽  
Håkan Nygren ◽  
Lennart Carlsson ◽  
Per Malmberg
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Membrane Lipids ◽  
Single Cells ◽  
Time Of Flight ◽  
Imaging Time ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

scholarly journals Peak picking as a pre-processing technique for imaging time of flight secondary ion mass spectrometry

2012 ◽  
Vol 45 (1) ◽  
pp. 461-465 ◽  
Author(s):  
Jimmy D. Moore ◽  
Alex Henderson ◽  
John S. Fletcher ◽  
Nicholas P. Lockyer ◽  
John C. Vickerman
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
Processing Technique ◽  
Peak Picking ◽  
Imaging Time ◽  
Ion Mass Spectrometry ◽  
Secondary Ion
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