In situ observations of nucleation and coalescence stages in Ge growth on Si surfaces using transmission electron microscope combined with molecular beam epitaxy chamber

1998 ◽  
Vol 16 (5) ◽  
pp. 2956-2960 ◽  
Author(s):  
Yuichi Hiroyama ◽  
Masao Tamura
Keyword(s):  
Electron Microscope ◽  
Molecular Beam Epitaxy ◽  
Transmission Electron Microscope ◽  
Molecular Beam ◽  
Transmission Electron ◽  
In Situ Observations ◽  
Molecular Beam Epitaxy Chamber

scholarly journals Molecular Beam Epitaxy of Germanium in the Atomic-Resolution Transmission Electron Microscope

2019 ◽  
Vol 25 (S1) ◽  
pp. 47-48
Author(s):  
Éric Ngo ◽  
Federico Panciera ◽  
Jean-Christophe Harmand ◽  
Weixi Wang ◽  
Martin Foldyna ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Molecular Beam Epitaxy ◽  
Transmission Electron Microscope ◽  
Molecular Beam ◽  
Atomic Resolution ◽  
Transmission Electron

In-Situ Studies of the MBE Growth of CoSi2 on Si (111) in a UHV Transmission Electron Microscope

1987 ◽  
Vol 94 ◽  
Author(s):  
J. M. Gibson ◽  
J. L. Batstone ◽  
R. T. Tung
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Ultrahigh Vacuum ◽  
Mbe Growth ◽  
In Situ Studies ◽  
Transmission Electron ◽  
Layer Mode ◽  
In Situ Observations

ABSTRACTIn-situ observations of the growth of CoSi2 films by Co deposition in an ultrahigh vacuum transmission electron microscope are described. Results include the observation of intermediate epitaxial phases (both hexagonally distorted Co2Si and CoSi) and the observation that pinholes nucleate in CoSi2 films after growth in a metastable layer mode.

Remote On-Line Control of a High-Voltage in situ Transmission Electron Microscope with A Rational User Interface

1996 ◽  
Vol 54 ◽  
pp. 384-385
Author(s):  
M.A. O’Keefe ◽  
J. Taylor ◽  
D. Owen ◽  
B. Crowley ◽  
K.H. Westmacott ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Electron Microscope ◽  
User Interface ◽  
Transmission Electron Microscope ◽  
High Voltage ◽  
Materials Science ◽  
Transmission Electron ◽  
On Line ◽  
Electron Microscopes

Remote on-line electron microscopy is rapidly becoming more available as improvements continue to be developed in the software and hardware of interfaces and networks. Scanning electron microscopes have been driven remotely across both wide and local area networks. Initial implementations with transmission electron microscopes have targeted unique facilities like an advanced analytical electron microscope, a biological 3-D IVEM and a HVEM capable of in situ materials science applications. As implementations of on-line transmission electron microscopy become more widespread, it is essential that suitable standards be developed and followed. Two such standards have been proposed for a high-level protocol language for on-line access, and we have proposed a rational graphical user interface. The user interface we present here is based on experience gained with a full-function materials science application providing users of the National Center for Electron Microscopy with remote on-line access to a 1.5MeV Kratos EM-1500 in situ high-voltage transmission electron microscope via existing wide area networks. We have developed and implemented, and are continuing to refine, a set of tools, protocols, and interfaces to run the Kratos EM-1500 on-line for collaborative research. Computer tools for capturing and manipulating real-time video signals are integrated into a standardized user interface that may be used for remote access to any transmission electron microscope equipped with a suitable control computer.

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