Feature scale simulation studies of TEOS‐sourced remote microwave plasma‐enhanced chemical vapor deposition of silicon dioxide: Role of oxygen atom recombination
1996 ◽
Vol 14
(3)
◽
pp. 977-983
◽
Keyword(s):
1995 ◽
Vol 13
(1)
◽
pp. 118
◽
Keyword(s):
1992 ◽
Vol 54-55
◽
pp. 368-373
◽
1992 ◽
pp. 368-373
1989 ◽
Vol 50
(C5)
◽
pp. C5-667-C5-672
1989 ◽
Vol 50
(C5)
◽
pp. C5-177-C5-188
◽
Keyword(s):