Microtribological studies of unlubricated and lubricated surfaces using atomic force/friction force microscopy

1996 ◽  
Vol 14 (4) ◽  
pp. 2378-2391 ◽  
Author(s):  
Vilas N. Koinkar ◽  
Bharat Bhushan
Keyword(s):  
Friction Force ◽  
Friction Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force

A Comparison of Lateral Calibration Techniques for Quantitative Friction Force Microscopy

2005 ◽  
Author(s):  
K. S. Kanaga Karuppiah ◽  
Sriram Sundararajan
Keyword(s):  
Friction Force ◽  
Lateral Force ◽  
Silicon Sample ◽  
Friction Force Microscopy ◽  
Friction Behavior ◽  
Force Microscopy ◽  
Atomic Force ◽  
Force Calibration ◽  
Calibration Techniques ◽  
Ultra High Molecular Weight

A comparison of two lateral force calibration techniques for friction force microscopy is presented. We used methods developed by Ogletree et.al. [1] and Ruan and Bhushan [2] to measure the friction response between the atomic force microscope (AFM) probe and a silicon sample and to obtain lateral force calibration factors. The factors were used to characterize the friction behavior and interfacial shear strength of a silicon nitride (Si3N4) probe-ultra high molecular weight polyethylene (UHMWPE) interface.

Atomic force microscopy and friction force microscopy studies of ferroelastic crystal surfaces

Wear ◽  
2000 ◽  
Vol 238 (1) ◽  
pp. 34-39 ◽  
Author(s):  
R. Czajka ◽  
S. Mielcarek ◽  
B. Mróz ◽  
S. Szuba ◽  
A. Kasuya ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Friction Force ◽  
Friction Force Microscopy ◽  
Crystal Surfaces ◽  
Force Microscopy ◽  
Atomic Force

Microtribological Studies by Using Atomic Force and Friction Force Microscopy and its Applications

1994 ◽  
Vol 332 ◽  
Author(s):  
Bharat Bhushan ◽  
Vilas N. Koinkar ◽  
J. Ruan
Keyword(s):  
Single Crystal ◽  
Friction Force ◽  
Single Crystal Silicon ◽  
Test Duration ◽  
Friction Force Microscopy ◽  
Crystal Silicon ◽  
Wear Rates ◽  
Force Microscopy ◽  
Atomic Force ◽  
Nanoindentation Hardness

ABSTRACTWe have used atomic force microscopy (AFM) and friction force microscopy (FFM) techniques for microtribological studies including microscale friction, nanowear, nanoscratching and nanoindentation hardness measurements. The microscale friction studies on a gold ruler sample demonstrated that the local variation in friction correspond to a change of local surface slope, and this correlation is explained by a friction mechanism. Directionality effect is also observed as the sample was scanned in either direction. Nanoscratching, nanowear and nanoindentation hardness studies were performed on single-crystal silicon. Wear rates of single crystal silicon are approximately constant for various loads and test duration. Nanoindentation hardness studies show that AFM technique allows the hardness measurements of surface monolayers and ultra thin films in multilayered structures at very shallow depths and low loads. The AFM technique has also been shown to be useful for nanofabrication.

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