Surface analysis at low to ultrahigh vacuum by ion scattering and direct recoil spectroscopy

1995 ◽  
Vol 13 (3) ◽  
pp. 1136-1144 ◽  
Author(s):  
M. S. Hammond ◽  
J. A. Schultz ◽  
A. R. Krauss
Keyword(s):  
Surface Analysis ◽  
Ultrahigh Vacuum ◽  
Ion Scattering

LOW ENERGY ION SCATTERING

2007 ◽  
Vol 14 (01) ◽  
pp. 31-41 ◽  
Author(s):  
FERIDOUN SAMAVAT ◽  
BRUCE V. KING ◽  
D. JOHN O'CONNOR
Keyword(s):  
Surface Analysis ◽  
Atomic Layer ◽  
Low Energy ◽  
Surface Atom ◽  
Ion Scattering ◽  
Low Energy Ion Scattering ◽  
Composition And Structure ◽  
Extreme Sensitivity ◽  
Low Energy Ions

Low energy ion scattering (LEIS) is the study of the composition and structure of a surface by the detection of low energy ions with energies ranging from 100 eV to 10 keV elastically scattered off the surface. The extreme sensitivity to the outermost atomic layer makes it as a unique tool for surface analysis. In this paper, concepts of shadowing, blocking, and also polar and azimuthal scans have been described. Surface order and surface atom spacings are revealed by using these concepts and measuring the intensity of backscattered projectiles as a function of the incident and azimuthal angles.

Experimental parameters for quantitative surface analysis by medium energy ion scattering

1976 ◽  
Vol 138 (2) ◽  
pp. 271-286 ◽  
Author(s):  
W.C. Turkenburg ◽  
H.H. Kersten ◽  
B.G. Colenbrander ◽  
A.P. De Jongh ◽  
F.W. Saris
Keyword(s):  
Surface Analysis ◽  
Medium Energy ◽  
Ion Scattering ◽  
Experimental Parameters ◽  
Quantitative Surface Analysis ◽  
Medium Energy Ion Scattering
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