Metal overlayers on self‐organized molecular assemblies. IV. Ion scattering spectroscopy of the Ag/CH3 interface

1994 ◽  
Vol 12 (4) ◽  
pp. 2410-2414 ◽  
Author(s):  
G. C. Herdt ◽  
A. W. Czanderna
Keyword(s):  
Ion Scattering ◽  
Molecular Assemblies ◽  
Self Organized ◽  
Ion Scattering Spectroscopy ◽  
Metal Overlayers

Metal Overlayers on Self-Organized Molecular Assemblies: X-ray Photoelectron Spectroscopy of CR/CM and NI/CM on 12-Nercaptododecanenitrile

1993 ◽  
Vol 304 ◽  
Author(s):  
D. R. Jung ◽  
A. W. Czanderna
Keyword(s):  
Binding Energy ◽  
Photoelectron Spectroscopy ◽  
Chemical Interaction ◽  
Molecular Assemblies ◽  
X Ray ◽  
Self Organized ◽  
Deposited Metal ◽  
Show Evidence ◽  
Metal Overlayers ◽  
End Group

AbstractOverlayers of Cr and Ni deposited at 22 °C and at -100 °C onto self-organized molecular assemblies of HS(CH2 )11 CN on Au have been studied by X-ray photoelectron spectroscopy (XPS). For the lowest overlayer coverages, the C ls and N is core levels show evidence for a chemical interaction between the deposited metal and the CN end-group. At 22 °C and for coverages of 0.6 nm or more, Cr/CN shows a C ls low binding energy, carbide-like shoulder. The degree of metal penetration is assessed based on the attenuation of the C ls and Au 4f intensities, and on the positions of the Cr and Ni 2p levels. In general, the least penetration and the largest binding energy shifts of the C, N, and the Cr or Ni core levels are observed for Cr/CN, while and Ni/CN shows smaller shifts and greater penetration.

Study of Diffusion and Defects by Medium-Energy Coaxial Impact-Collision Ion Scattering Spectroscopy

2000 ◽  
Vol 183-185 ◽  
pp. 207-214 ◽  
Author(s):  
Takayuki Kobayashi ◽  
C.F. McConville ◽  
J. Nakamura ◽  
G. Dorenbos ◽  
H. Sone ◽  
...  
Keyword(s):  
Medium Energy ◽  
Ion Scattering ◽  
Ion Scattering Spectroscopy

Change in polarity of zinc oxide films grown on sapphire substrates without insertion of any buffer layer

2008 ◽  
Vol 23 (12) ◽  
pp. 3269-3272 ◽  
Author(s):  
Yutaka Adachi ◽  
Naoki Ohashi ◽  
Tsuyoshi Ohnishi ◽  
Takeshi Ohgaki ◽  
Isao Sakaguchi ◽  
...  
Keyword(s):  
Zinc Oxide ◽  
Zno Films ◽  
Ion Scattering ◽  
Ceramic Target ◽  
Interfacial Phase ◽  
Sapphire Substrates ◽  
Zinc Oxide Films ◽  
Ion Scattering Spectroscopy ◽  
Doped Zno ◽  
Polarity Change

We have investigated the polarity of zinc oxide (ZnO) and Al-doped ZnO films grown on (11¯20) and (0001) sapphire substrates, using coaxial impact collision ion scattering spectroscopy. The films grown by pulsed laser deposition with a nominally undoped ZnO ceramic target had a (000¯1) surface, whereas the films prepared with a 1 mol% Al-doped ZnO ceramic target had a (0001) surface. The usage of Al-doped and undoped targets caused no difference in the in-plane lattice orientation. Electron microscope observations revealed that polarity change due to doping occurred without the formation of any interfacial phase between ZnO and sapphire.

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