Geometrical structure of the Bi/GaP (110) interface: An x‐ray standing wave triangulation study of a nonideal system

1994 ◽  
Vol 12 (4) ◽  
pp. 2473-2477 ◽  
Author(s):  
A. Herrera‐Gómez ◽  
T. Kendelewicz ◽  
J. C. Woicik ◽  
K. E. Miyano ◽  
P. Pianetta ◽  
...  
Keyword(s):  
Standing Wave ◽  
Geometrical Structure ◽  
X Ray ◽  
Nonideal System

scholarly journals Geometrical structure of an iron epilayer on Si (111) : an X-ray standing wave analysis

1992 ◽  
Vol 2 (6) ◽  
pp. 1215-1232 ◽  
Author(s):  
J. C. Boulliard ◽  
B. Capelle ◽  
D. Ferret ◽  
A. Lifchitz ◽  
C. Malgrange ◽  
...  
Keyword(s):  
Standing Wave ◽  
Geometrical Structure ◽  
Wave Analysis ◽  
X Ray

Voltage and Orientation Dependence of Characteristic X-Ray Production in Thin Crystals

1985 ◽  
Vol 43 ◽  
pp. 414-415
Author(s):  
G. Thomas ◽  
K. M. Krishnan ◽  
Y. Yokota ◽  
H. Hashimoto
Keyword(s):  
Standing Wave ◽  
Incident Beam ◽  
Orientation Dependence ◽  
Incident Plane Wave ◽  
Crystalline Materials ◽  
X Ray ◽  
Incident Plane ◽  
Crystal Unit Cell ◽  
Beam Orientation ◽  
Acceleration Voltage

For crystalline materials, an incident plane wave of electrons under conditions of strong dynamical scattering sets up a standing wave within the crystal. The intensity modulations of this standing wave within the crystal unit cell are a function of the incident beam orientation and the acceleration voltage. As the scattering events (such as inner shell excitations) that lead to characteristic x-ray production are highly localized, the x-ray intensities in turn, are strongly determined by the orientation and the acceleration voltage. For a given acceleration voltage or wavelength of the incident wave, it has been shown that this orientation dependence of the characteristic x-ray emission, termed the “Borrmann effect”, can also be used as a probe for determining specific site occupations of elemental additions in single crystals.

scholarly journals X-ray standing wave study of CdTe/MnTe/CdTe(001) heterointerfaces

1997 ◽  
Vol 81 (3) ◽  
pp. 1173-1179 ◽  
Author(s):  
J. C. Boulliard ◽  
B. Capelle ◽  
S. Gualandris ◽  
A. Lifchitz ◽  
J. Cibert ◽  
...  
Keyword(s):  
Standing Wave ◽  
X Ray

Fluorescence x-ray standing wave study on (AlAs)(GaAs) superlattices

1999 ◽  
Vol 32 (10A) ◽  
pp. A65-A70 ◽  
Author(s):  
A Lessmann ◽  
M Schuster ◽  
H Riechert ◽  
S Brennan ◽  
A Munkholm ◽  
...  
Keyword(s):  
Standing Wave ◽  
X Ray

High-resolution X-ray diffraction and X-ray standing wave analyses of (AlAs)m(GaAs)nshort-period superlattices

1995 ◽  
Vol 28 (4A) ◽  
pp. A206-A211 ◽  
Author(s):  
M Schuster ◽  
A Lessmann ◽  
A Munkholm ◽  
S Brennan ◽  
G Materliks ◽  
...  
Keyword(s):  
High Resolution ◽  
Standing Wave ◽  
X Ray Diffraction ◽  
X Ray

scholarly journals Standing-wave excited soft x-ray photoemission microscopy: Application to Co microdot magnetic arrays

2010 ◽  
Vol 97 (6) ◽  
pp. 062503 ◽  
Author(s):  
Alexander X. Gray ◽  
Florian Kronast ◽  
Christian Papp ◽  
See-Hun Yang ◽  
Stefan Cramm ◽  
...  
Keyword(s):  
Standing Wave ◽  
X Ray

The structure of the surface phase: a new normal-incidence X-ray standing wave study

2000 ◽  
Vol 453 (1-3) ◽  
pp. 183-190 ◽  
Author(s):  
G.J. Jackson ◽  
S.M. Driver ◽  
D.P. Woodruff ◽  
B.C.C. Cowie ◽  
R.G. Jones
Keyword(s):  
Standing Wave ◽  
Normal Incidence ◽  
Surface Phase ◽  
New Normal ◽  
X Ray

A simple X-ray standing wave technique for surface structure determination - theory and an application

1988 ◽  
Vol 195 (1-2) ◽  
pp. 237-254 ◽  
Author(s):  
D.P. Woodruff ◽  
D.L. Seymour ◽  
C.F. McConville ◽  
C.E. Riley ◽  
M.D. Crapper ◽  
...  
Keyword(s):  
Surface Structure ◽  
Standing Wave ◽  
Structure Determination ◽  
X Ray ◽  
Wave Technique
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