Pressure measurement by laser ionization: Direct counting of generated ions by imaging of their spatial distribution

1994 ◽  
Vol 12 (4) ◽  
pp. 1734-1739 ◽  
Author(s):  
S. Ichimura ◽  
S. Sekine ◽  
K. Kokubun ◽  
H. Shimizu
Keyword(s):  
Spatial Distribution ◽  
Pressure Measurement ◽  
Laser Ionization ◽  
Direct Counting

Kinetic energy and spatial distribution of ions in high irradiance laser ionization source

2011 ◽  
Vol 26 (6) ◽  
pp. 1183 ◽  
Author(s):  
Yiming Lin ◽  
Ruibin Xu ◽  
Lingfeng Li ◽  
Wei Hang ◽  
Jian He ◽  
...  
Keyword(s):  
Spatial Distribution ◽  
Kinetic Energy ◽  
High Irradiance ◽  
Laser Ionization ◽  
Ionization Source

scholarly journals Extremely-high vacuum system for the pressure measurement using the laser-ionization method.

Shinku ◽  
1991 ◽  
Vol 34 (1) ◽  
pp. 14-16 ◽  
Author(s):  
Kiyohide KOKUBUN ◽  
Hazime SHIMIZU ◽  
Shingo ICHIMURA ◽  
Humio KAWAHARA ◽  
Minoru KONDO
Keyword(s):  
Pressure Measurement ◽  
High Vacuum ◽  
Vacuum System ◽  
Laser Ionization ◽  
Ionization Method

Preliminary Results of Vacuum Pressure Measurement by Laser Ionization Method

1987 ◽  
Vol 26 (Part 2, No. 5) ◽  
pp. L573-L575 ◽  
Author(s):  
Shingo Ichimura ◽  
Kiyohide Kokubun ◽  
Hazime Shimizu
Keyword(s):  
Pressure Measurement ◽  
Vacuum Pressure ◽  
Laser Ionization ◽  
Preliminary Results ◽  
Ionization Method

scholarly journals Pressure measurement with laser. 1. Laser-ionization characteristics of various kinds of gases.

Shinku ◽  
1990 ◽  
Vol 33 (1) ◽  
pp. 7-14
Author(s):  
Kiyohide KOKUBUN ◽  
Shingo ICHIMURA ◽  
Hazime SHIMIZU
Keyword(s):  
Pressure Measurement ◽  
Laser Ionization

Pressure measurement method using laser ionization for xhv

Vacuum ◽  
1993 ◽  
Vol 44 (5-7) ◽  
pp. 657-659 ◽  
Author(s):  
K Kokubun ◽  
S Ichimura ◽  
H Shimizu ◽  
S Sekine
Keyword(s):  
Pressure Measurement ◽  
Measurement Method ◽  
Laser Ionization

Improvement in the ion-detection sensitivity of the pressure measurement method using nonresonant laser ionization

Vacuum ◽  
1997 ◽  
Vol 48 (7-9) ◽  
pp. 727-729
Author(s):  
K Kokubun ◽  
S Ichimura ◽  
M Hirata ◽  
S Sekine ◽  
A Kurokawa
Keyword(s):  
Pressure Measurement ◽  
Measurement Method ◽  
Detection Sensitivity ◽  
Laser Ionization ◽  
Ion Detection

Lithography below 100 nm

1983 ◽  
Vol 41 ◽  
pp. 96-99
Author(s):  
L. D. Jackel
Keyword(s):  
Spatial Distribution ◽  
Electron Beam ◽  
Electron Scattering ◽  
Electron Beam Lithography ◽  
Substrate Material ◽  
Local Electron ◽  
Electron Dose ◽  
Positive Resist ◽  
Exposure Process

Most production electron beam lithography systems can pattern minimum features a few tenths of a micron across. Linewidth in these systems is usually limited by the quality of the exposing beam and by electron scattering in the resist and substrate. By using a smaller spot along with exposure techniques that minimize scattering and its effects, laboratory e-beam lithography systems can now make features hundredths of a micron wide on standard substrate material. This talk will outline sane of these high- resolution e-beam lithography techniques.We first consider parameters of the exposure process that limit resolution in organic resists. For concreteness suppose that we have a “positive” resist in which exposing electrons break bonds in the resist molecules thus increasing the exposed resist's solubility in a developer. Ihe attainable resolution is obviously limited by the overall width of the exposing beam, but the spatial distribution of the beam intensity, the beam “profile” , also contributes to the resolution. Depending on the local electron dose, more or less resist bonds are broken resulting in slower or faster dissolution in the developer.

SEM evaluation of the TEM cold-stage double-film specimen

1984 ◽  
Vol 42 ◽  
pp. 272-273
Author(s):  
Jayesh Bellare
Keyword(s):  
Spatial Distribution ◽  
Sample Preparation ◽  
Sample Thickness ◽  
Specimen Preparation ◽  
Preparation Technique ◽  
Liquid Sample ◽  
Thin Specimen ◽  
Sample Preparation Technique ◽  
Cold Stage ◽  
Film Specimen

Seeing is believing, but only after the sample preparation technique has received a systematic study and a full record is made of the treatment the sample gets.For microstructured liquids and suspensions, fast-freeze thermal fixation and cold-stage microscopy is perhaps the least artifact-laden technique. In the double-film specimen preparation technique, a layer of liquid sample is trapped between 100- and 400-mesh polymer (polyimide, PI) coated grids. Blotting against filter paper drains excess liquid and provides a thin specimen, which is fast-frozen by plunging into liquid nitrogen. This frozen sandwich (Fig. 1) is mounted in a cooling holder and viewed in TEM.Though extremely promising for visualization of liquid microstructures, this double-film technique suffers from a) ireproducibility and nonuniformity of sample thickness, b) low yield of imageable grid squares and c) nonuniform spatial distribution of particulates, which results in fewer being imaged.

Macroprobe Mode for the Study of Segregation in Steels

1990 ◽  
Vol 48 (2) ◽  
pp. 260-261
Author(s):  
Auclair Gilles ◽  
Benoit Danièle
Keyword(s):  
Mechanical Properties ◽  
Spatial Distribution ◽  
High Performance ◽  
Volume Fraction ◽  
Sheet Steel ◽  
Acquisition Time ◽  
Chemical Information ◽  
X Ray ◽  
Accurate Quantitative Analysis ◽  
Optical Micrographs

During these last 10 years, high performance correction procedures have been developed for classical EPMA, and it is nowadays possible to obtain accurate quantitative analysis even for soft X-ray radiations. It is also possible to perform EPMA by adapting this accurate quantitative procedures to unusual applications such as the measurement of the segregation on wide areas in as-cast and sheet steel products.The main objection for analysis of segregation in steel by means of a line-scan mode is that it requires a very heavy sampling plan to make sure that the most significant points are analyzed. Moreover only local chemical information is obtained whereas mechanical properties are also dependant on the volume fraction and the spatial distribution of highly segregated zones. For these reasons we have chosen to systematically acquire X-ray calibrated mappings which give pictures similar to optical micrographs. Although mapping requires lengthy acquisition time there is a corresponding increase in the information given by image anlysis.

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