In situ scanning electron microscope observation of hillock and whisker growth on Al–Ta alloy films for interconnections of thin film transistor–liquid crystal displays

1994 ◽  
Vol 12 (5) ◽  
pp. 2922-2924 ◽  
Author(s):  
E. Iwamura ◽  
T. Ohnishi ◽  
K. Yoshikawa ◽  
K. Itayama
Keyword(s):  
Thin Film ◽  
Liquid Crystal ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Whisker Growth ◽  
Thin Film Transistor ◽  
Liquid Crystal Displays ◽  
Electron Microscope Observation ◽  
Scanning Electron

In-Situ Measurement of Bending Strength of TiC Whiskers in the Scanning Electron Microscope

1994 ◽  
Vol 365 ◽  
Author(s):  
Yutaka Seino ◽  
Shoichiro Shin ◽  
Satoshi Nagai
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Bending Strength ◽  
Whisker Growth ◽  
Growth Direction ◽  
Three Point Bending ◽  
Cleavage Strength ◽  
The Difference ◽  
Scanning Electron

ABSTRACTThe three–point bending strength of TiC whiskers was measured in a scanning electron microscope. The whisker samples have ∼ 50µm length and 2∼4µm diameter and are commercially available as reinforcements for composite materials. The distribution of the bending strengths of the whiskers showed a double peak around 5.2GPa and 30.4GPa, respectively. The difference in these values is attributed to differences in the cleavage strength of two crystal planes depending on whisker growth direction.

Effect of Briquetting Pressure on the Performance of In Situ Formed Sialon in Al2O3-C Refractory Bricks

2014 ◽  
Vol 881-883 ◽  
pp. 1049-1052 ◽  
Author(s):  
Nai Peng ◽  
Cheng Ji Deng ◽  
Hong Xi Zhu
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
X Ray Diffraction ◽  
X Ray ◽  
Z Value ◽  
Refractory Bricks ◽  
Scanning Electron

In this paper, the effects of briquetting pressure on the performance of in-situ formed Sialon in Al2O3-C refractory bricks are investigated. The phase compositions and microstructure of the Al2O3-C refractory were investigated by X-ray diffraction (XRD) and scanning electron microscope (SEM).The results show the briquetting pressure hardly has effect on the phase of the sintered specimens, two new phases of Sialon with a Z value of 2 and SiC formed. The micrographs of Sialon crystals have the shape of both column and tabular column, but with a cone tip in the specimens sintered at 200MPa and 300MPa and smooth tip in specimens sintered at 400MPa and 500MPa.

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