Physical properties of radio‐frequency magnetron sputtered Pb(Zr,Ti)O3 thin films: Direct determination of oxygen composition by Rutherford backscattering spectroscopy and nuclear reaction analysis*

1993 ◽  
Vol 11 (5) ◽  
pp. 2808-2815 ◽  
Author(s):  
E. Cattan ◽  
B. Agius ◽  
H. Achard ◽  
J. C. Cheang Wong ◽  
C. Ortega ◽  
...  
Keyword(s):  
Thin Films ◽  
Radio Frequency ◽  
Physical Properties ◽  
Nuclear Reaction ◽  
Direct Determination ◽  
Rutherford Backscattering ◽  
Radio Frequency Magnetron ◽  
Rutherford Backscattering Spectroscopy ◽  
Nuclear Reaction Analysis

scholarly journals Application of Nuclear Techniques to the Investigation of the Oxidation Behavior of Ion-Implanted Steels

2019 ◽  
Vol 7 ◽  
pp. 222
Author(s):  
F. Noli ◽  
P. Misaelides
Keyword(s):  
Nuclear Reaction ◽  
Oxidation Behavior ◽  
Depth Distribution ◽  
Rutherford Backscattering ◽  
Rutherford Backscattering Spectroscopy ◽  
Aluminum Concentration ◽  
Near Surface ◽  
Depth Profiles ◽  
Ion Implanted

The oxidation behavior of ion-implanted steel samples in air, using Nuclear Reaction Analysis (NRA) and Rutherford Backscattering Spectroscopy (RBS) techniques. Austenitic stainless steel AISI 321 (Fe/Crl8/Ni8/Mn2/Ti) samples implanted with magnesium-, aluminum- and zirconium-ions (implantation energy 40 keV, dose: 1-1017 to 2-1017 ions/cm2) were oxidized in air in the temperature region 450-650 °C for several periods of time. The above implants were selected on the basis of the affinity to oxygen, as well as their ability to form protective oxides as MgO, AI2O3, Zr02 in order to improve the oxidation resistance of steel. The determination of the oxygen concentration and depth-profiles was performed by means of the 160(d, p)170 nuclear reaction. Rutherford Backscattering Spectroscopy was applied to investigate the near-surface layers and to determine the depth profiles of the implanted ions. The determination of the aluminum concentration and the depth distribution of the Al-ions was performed using the resonance at 992 keV of the 27Al(p, 7)28Si nuclear reaction whereas the concentration and the depth distribution of the Mg-ions by the means of the 24Mg(o;, p)27Al reaction. The excitation function of the 24Mg(a:, p)27Al nuclear reaction was studied in the energy region 4600-5000 keV and absolute cross section data allowing the determination of the Mg-profile were determined for this purpose.

Experimental Simulation of Contamination Arising From Electro Rocket Engine-Jet on Surface of Spacecraft Units

1999 ◽  
Vol 591 ◽  
Author(s):  
A. Chirov ◽  
A. Nadiradze ◽  
V. Shaposhniko ◽  
V. Egorov
Keyword(s):  
Angular Distribution ◽  
Nuclear Reaction ◽  
Rocket Engine ◽  
Rutherford Backscattering ◽  
Rutherford Backscattering Spectroscopy ◽  
Experimental Simulation ◽  
Nuclear Reaction Analysis ◽  
Space Craft ◽  
Film Composition ◽  
Preliminary Estimation

ABSTRACTUnder conditions of a vacuum simulation it was investigated how electric rocket thruster (ERT) SPT-70 contaminates space craft (SC) surfaces. The contamination content in the ERT jet was studied by using solid targets. The film composition was analysed by Rutherford backscattering spectroscopy (RBS) He+ ions and nuclear reaction analysis (NRA) with H+ ions methods. Using the results of this analysis a preliminary estimation of the composition and the angular distribution of contaminated components in the ERT jet were carried out.

Luminescent Porous Silicon Investigated by accelerator analytics

1992 ◽  
Vol 281 ◽  
Author(s):  
Peter Steiner ◽  
Jens Weidhaas ◽  
Walter Lang
Keyword(s):  
Porous Silicon ◽  
Nuclear Reaction ◽  
Oxygen Content ◽  
Rutherford Backscattering ◽  
Rutherford Backscattering Spectroscopy ◽  
Nuclear Reaction Analysis ◽  
Nanoporous Silicon

ABSTRACTElectroluminescent nanoporous silicon is investigated by accelerator techniques. Rutherford Backscattering Spectroscopy (RBS) and Nuclear Reaction Analysis (NRA) are used to measure the oxygen content. The stoichiometry is Si1O1.8 in the top layer and Si1O0.8 in 6 μm depth. Channeling experiments show that only very weak channels are present.

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