Effects of predeposition HF/NH4F treatments on the electrical properties of SiO2/Si structures formed by low‐temperature plasma‐assisted oxidation and deposition processes
1993 ◽
Vol 11
(4)
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pp. 945-951
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Keyword(s):
Keyword(s):
1998 ◽
Vol 227-230
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pp. 861-865
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2012 ◽
Vol 1
(5)
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pp. 16-22
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Keyword(s):
2020 ◽
Vol 1588
◽
pp. 012031
Keyword(s):
1996 ◽
Vol 104-105
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pp. 335-341
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1993 ◽
pp. 145-156
1997 ◽
Vol 117
(10)
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pp. 1262-1268
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