Structural investigation of Rb adsorption on Al(111) using normal incidence standing x‐ray wavefield absorption triangulation

1992 ◽  
Vol 10 (4) ◽  
pp. 2148-2153 ◽  
Author(s):  
M. Kerkar ◽  
D. Fisher ◽  
D. P. Woodruff ◽  
Robert G. Jones ◽  
R. D. Diehl ◽  
...  
Keyword(s):  
Structural Investigation ◽  
Normal Incidence ◽  
X Ray

Structural investigation of the adsorption of SnPc on Ag(111) using normal-incidence x-ray standing waves

2006 ◽  
Vol 74 (3) ◽  
Author(s):  
C. Stadler ◽  
S. Hansen ◽  
F. Pollinger ◽  
C. Kumpf ◽  
E. Umbach ◽  
...  
Keyword(s):  
Structural Investigation ◽  
Standing Waves ◽  
Normal Incidence ◽  
X Ray

SOFT X-RAY IMAGES OF THE SOLAR CORONA USING NORMAL INCIDENCE OPTICS

1988 ◽  
Vol 49 (C1) ◽  
pp. C1-115-C1-118 ◽  
Author(s):  
M. E. BRUNER ◽  
B. M. HAISCH ◽  
W. A. BROWN ◽  
L. W. ACTON ◽  
J. H. UNDERWOOD
Keyword(s):  
Solar Corona ◽  
Normal Incidence ◽  
X Ray

Structural investigation of spherical hollow excipient Mannit Q by X-ray microtomography

2015 ◽  
Vol 495 (1) ◽  
pp. 140-143 ◽  
Author(s):  
Ryusuke Kajihara ◽  
Shuji Noguchi ◽  
Yasunori Iwao ◽  
Yuki Yasuda ◽  
Megumi Segawa ◽  
...  
Keyword(s):  
Structural Investigation ◽  
X Ray ◽  
Spherical Hollow

Notizen: Synthesis and Structural Investigation of an Unusual Double Hydrogen-Bridged Dimeric Cyclophosphazene Derivative

1976 ◽  
Vol 31 (7) ◽  
pp. 995-996 ◽  
Author(s):  
Graham J. Bullen ◽  
Peter E. Dann ◽  
Moyra L. Evans ◽  
Michael B. Hursthouse ◽  
Robert A. Shaw ◽  
...  
Keyword(s):  
Structural Investigation ◽  
Neutral Molecule ◽  
X Ray ◽  
H Nmr ◽  
Double Hydrogen

The formation, 1H NMR spectroscopic and X-ray crystallographic investigations of a double hydrogen-bridged tricyclic system of a cyclotriphosphazadiene derivative,[N3HP3(O)Cl2(NEt2)3]2are described and discussed. This is the first neutral molecule having both cyclophosphazene and cyclophosphazane character to be structurally investigated.

Structural investigation of Li2SiS3 glass using X-ray RDF

1995 ◽  
Vol 95 (8) ◽  
pp. 499-502 ◽  
Author(s):  
K. Muruganandam ◽  
M. Seshasayee
Keyword(s):  
Structural Investigation ◽  
X Ray

Anin situatomic force microscope for normal-incidence nanofocus X-ray experiments

2016 ◽  
Vol 23 (5) ◽  
pp. 1110-1117 ◽  
Author(s):  
M. V. Vitorino ◽  
Y. Fuchs ◽  
T. Dane ◽  
M. S. Rodrigues ◽  
M. Rosenthal ◽  
...  
Keyword(s):  
Thin Film ◽  
Atomic Force Microscope ◽  
High Speed ◽  
Normal Incidence ◽  
Organic Thin Film ◽  
X Ray ◽  
Atomic Force ◽  
Synchrotron Beamlines

A compact high-speed X-ray atomic force microscope has been developed forin situuse in normal-incidence X-ray experiments on synchrotron beamlines, allowing for simultaneous characterization of samples in direct space with nanometric lateral resolution while employing nanofocused X-ray beams. In the present work the instrument is used to observe radiation damage effects produced by an intense X-ray nanobeam on a semiconducting organic thin film. The formation of micrometric holes induced by the beam occurring on a timescale of seconds is characterized.

The structure of the surface phase: a new normal-incidence X-ray standing wave study

2000 ◽  
Vol 453 (1-3) ◽  
pp. 183-190 ◽  
Author(s):  
G.J. Jackson ◽  
S.M. Driver ◽  
D.P. Woodruff ◽  
B.C.C. Cowie ◽  
R.G. Jones
Keyword(s):  
Standing Wave ◽  
Normal Incidence ◽  
Surface Phase ◽  
New Normal ◽  
X Ray
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