High mass resolution surface imaging with a time‐of‐flight secondary ion mass spectroscopy scanning microprobe

1991 ◽  
Vol 9 (6) ◽  
pp. 2864-2871 ◽  
Author(s):  
J. Schwieters ◽  
H.‐G. Cramer ◽  
T. Heller ◽  
U. Jürgens ◽  
E. Niehuis ◽  
...  
Keyword(s):  
Mass Spectroscopy ◽  
Time Of Flight ◽  
Mass Resolution ◽  
High Mass ◽  
Surface Imaging ◽  
Secondary Ion Mass Spectroscopy ◽  
High Mass Resolution ◽  
Secondary Ion

An investigation of the wear track on DLC (a-C:H) film by time-of-flight secondary ion mass spectroscopy

2001 ◽  
Vol 146-147 ◽  
pp. 378-383 ◽  
Author(s):  
Haruyo Fukui ◽  
Miki Irie ◽  
Yoshiharu Utsumi ◽  
Kazuhiko Oda ◽  
Hisanori Ohara
Keyword(s):  
Mass Spectroscopy ◽  
Wear Track ◽  
Time Of Flight ◽  
Secondary Ion Mass Spectroscopy ◽  
Secondary Ion

Performance of the new high mass resolution time of flight atom probe

1981 ◽  
Vol 52 (6) ◽  
pp. 810-818 ◽  
Author(s):  
Osamu Nishikawa ◽  
Kazuaki Kurihara ◽  
Masahiro Nachi ◽  
Morikazu Konishi ◽  
Minoru Wada
Keyword(s):  
Time Of Flight ◽  
Atom Probe ◽  
Mass Resolution ◽  
High Mass ◽  
Resolution Time ◽  
High Mass Resolution
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