Thermal noise in vacuum scanning tunneling microscopy at zero bias voltage
1990 ◽
Vol 8
(1)
◽
pp. 590-593
◽
Keyword(s):
Search of optimum bias voltage for oxide patterning on Si using scanning tunneling microscopy in air
2000 ◽
Vol 18
(2)
◽
pp. 639
◽
Keyword(s):
2019 ◽
Vol 21
(20)
◽
pp. 10540-10551
◽
2013 ◽
Vol 31
(4)
◽
pp. 04D103
◽
Keyword(s):
2013 ◽
Vol 19
(6)
◽
pp. 1569-1574
◽