In situ ellipsometry as a diagnostic of thin‐film growth: Studies of amorphous carbon
1989 ◽
Vol 7
(3)
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pp. 1378-1385
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2018 ◽
Vol 89
(12)
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pp. 123702
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Keyword(s):
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2011 ◽
pp. 180-211
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Keyword(s):
1997 ◽
Vol 15
(5)
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pp. 2709-2716
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Keyword(s):
Reflection high-energy electron diffraction (RHEED) for in situ characterization of thin film growth
2011 ◽
pp. 3-28
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Keyword(s):
2001 ◽
Vol 72
(8)
◽
pp. 3344-3348
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