In situ ellipsometry as a diagnostic of thin‐film growth: Studies of amorphous carbon

1989 ◽  
Vol 7 (3) ◽  
pp. 1378-1385 ◽  
Author(s):  
R. W. Collins
1999 ◽  
Vol 433-435 ◽  
pp. 770-774 ◽  
Author(s):  
I.D Baikie ◽  
U Petermann ◽  
B Lägel

1994 ◽  
Author(s):  
Per Skytt ◽  
Carl J. Englund ◽  
Nial Wassdahl ◽  
Derrick C. Mancini ◽  
Joseph Nordgren

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