Optical characterization of SiO1.1 silicon oxide layers on InSb

1987 ◽  
Vol 5 (4) ◽  
pp. 1115-1119
Author(s):  
G. Remond ◽  
R. Caye ◽  
P. H. Holloway ◽  
P. Ruzakowski
Keyword(s):  
Silicon Oxide ◽  
Optical Characterization ◽  
Oxide Layers

Polycrystalline Silicon Layers with Enhanced Thermal Stability

2011 ◽  
Vol 178-179 ◽  
pp. 385-391
Author(s):  
David Lysáček ◽  
Jan Šik ◽  
Petr Bábor
Keyword(s):  
Electron Microscopy ◽  
Grain Growth ◽  
Polycrystalline Silicon ◽  
Silicon Oxide ◽  
Silicon Layer ◽  
Multilayer System ◽  
Oxide Layers ◽  
Transmission Electron ◽  
Subsequent Loss

We report on a new method of external gettering in silicon substrate for semiconductor applications. The proposed method is based on the deposition of a multilayer system formed by introducing a number of thin buried silicon oxide layers into the thick polycrystalline silicon layer deposited on the wafer backside. Oxide films of a few nanometer thicknesses significantly retard both the grain growth and subsequent loss of the gettering capability of the polycrystalline silicon layer during high temperature annealing. The mechanisms of the grain growth and the influence of the embedded oxide layers on the gettering function in the multilayer system are discussed. We used scanning electron microscopy and transmission electron microscopy for the characterization of the multilayer system, and intentional contamination for demonstration of the gettering properties.

Optical Characterization of Oxide Encapsulated Silicon Nanowires of Various Morphologies

2008 ◽  
Vol 8 (8) ◽  
pp. 4202-4206 ◽  
Author(s):  
Sharon M. King ◽  
Shweta Chaure ◽  
Satheesh Krishnamurthy ◽  
Werner J. Blau ◽  
Alan Colli ◽  
...  
Keyword(s):  
Silicon Nanowires ◽  
Silicon Oxide ◽  
Crystalline Silicon ◽  
Silicon Nanowire ◽  
Visible Spectrum ◽  
Optical Characterization ◽  
Nanocrystalline Silicon ◽  
Oxide Nanowires ◽  
Emitting Species

The optical properties of four different silicon nanowire structures were investigated. Two of the samples consisted of spheres of nanocrystalline silicon en-capsulated by silicon oxide nanowires, with other two consisting of crystalline silicon nanowires coated by silicon oxide shells. The nanostructures produced by oxide assisted growth consisted of spheres of crystalline silicon encapsulated by silicon oxide shells. The absorption and photoluminescence of the different structures of the sample are investigated. The emitting species responsible for photoluminescence across the visible spectrum are discussed.

Different theoretical approaches at optical characterization of randomly rough silicon surfaces covered with native oxide layers

2018 ◽  
Vol 50 (11) ◽  
pp. 1230-1233 ◽  
Author(s):  
Ivan Ohlídal ◽  
Jiří Vohánka ◽  
Jan Mistrík ◽  
Martin Čermák ◽  
Daniel Franta
Keyword(s):  
Optical Characterization ◽  
Silicon Surfaces ◽  
Native Oxide ◽  
Oxide Layers ◽  
Theoretical Approaches

Crystal Growth and Electro-optical Characterization of In2Se2.7Sb0.3 Compound

2020 ◽  
Vol 12 (4) ◽  
pp. 04022-1-04022-4
Author(s):  
Piyush Patel ◽  
◽  
S. M. Vyas ◽  
Vimal Patel ◽  
Himanshu Pavagadhi ◽  
...  
Keyword(s):  
Crystal Growth ◽  
Optical Characterization

Optical Characterization of Monodispersed Aaqueous Cu2+-Doped CdS Nanoparticles Prepared Under Microwave Irradiation Conditions

2014 ◽  
Vol 01 (999) ◽  
pp. 1-1
Author(s):  
Wei Zhu ◽  
Qihui Shen ◽  
Xinjian Bao ◽  
Xiao Bai ◽  
Tingting Li ◽  
...  
Keyword(s):  
Microwave Irradiation ◽  
Optical Characterization ◽  
Cds Nanoparticles

Application of Kubelka-Munk model on the optical characterization of translucent dental zirconia

2021 ◽  
Vol 258 ◽  
pp. 123994
Author(s):  
Luciana M. Schabbach ◽  
Bruno C. dos Santos ◽  
Letícia S. De Bortoli ◽  
Márcio Celso Fredel ◽  
Bruno Henriques
Keyword(s):  
Optical Characterization

scholarly journals Magneto-optical characterization of ZnO / Ni nano-laminate obtained via Atomic Layer Deposition

2021 ◽  
Vol 1762 (1) ◽  
pp. 012041
Author(s):  
K Buchkov ◽  
A Galluzzi ◽  
B Blagoev ◽  
A Paskaleva ◽  
P Terziyska ◽  
...  
Keyword(s):  
Atomic Layer Deposition ◽  
Atomic Layer ◽  
Optical Characterization ◽  
Layer Deposition
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